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| Innovative optical solutions offer the ability for height-measurements of thin layers down to a few nanometers. | |
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| Calotte grinding |
| Measure the thickness of thin layers of material samples or large components according to DIN V ENV 1071 standard. |
| Application details |
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| Downloads
Try AxioVision LE
AxioVision Software
Specifications (100 KB)
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| TIC |
| Perform non-contact and vibration-free height measurements of thin layers in interference images. |
| Application details |
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