TIC

TIC – Advances in measurement

Standards in measuring techniques – by means of circular polarized light, it is easy to measure step heights, whereby the interference pattern direction can be adjusted to the specimen (see figures). With a measuring range of about 5 µm. With clearly defined levels, precision up to 20 nm may be achieved! TIC – Total Interference Contrast: an innovative technique, easy to use and attractive in price.

Overview Contrasting Methods

Brochure
TIC – Optical height measurement
in the nanometer range

Article
Pulsed Laser Deposition and TIC microscopy
(470 KB)

Deutsche Version

	TIC – Advances in measurement

	Standards in measuring techniques – by means of circular polarized light, it is easy to measure step heights, whereby the interference pattern direction can be adjusted to the specimen (see figures). With a measuring range of about 5 µm. With clearly defined levels, precision up to 20 nm may be achieved! TIC – Total Interference Contrast: an innovative technique, easy to use and attractive in price.		Overview Contrasting Methods Brochure TIC – Optical height measurement in the nanometer range Article Pulsed Laser Deposition and TIC microscopy (470 KB) Deutsche Version