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Axio Imager 2 is an investment in the future, whether in the area of research, testing or failure analysis. Here you will find a system integrated platform that offers you the perfect support for your applications. Time and again the modular structure and application-specific components will adapt to the growing and changing needs faced in our fast paced world.
Application Examples
(Click on the image to get an elarged view.)
![Liquid-crystalline phase of [C14mim]Br](/C12567BE00472A5C/GraphikTitelIntern/01s/$File/01s.jpg) | | Liquid-crystalline phase of [C14mim]Br
Polarization contrast
EC EPIPLAN 10x/0.20
at 100 °C in a THMS600 Linkam heating stage
Anna Getsis and Anja-Verena Mudring, Faculty of Chemistry and Biochemistry, Solid-State Chemistry and Materials, Ruhr-University Bochum, Germany |
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 | | Bundle of stretched polyelectrolyte molecules
Rhodamine G stain with fluorescence
LD EC Epiplan-NEOFLUAR 100x/0.75
Konstantin Demidenok, Leibniz Institute of Polymer Research Dresden e.V., Germany |
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 | | Tetrahedral inclusions in glass
Brightfield
SCHOTT AG, Corporate Research and Technology Development, Mainz, Germany |
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 | | Surface of a monocrystalline silicon solar cell
Brightfield
EC Epiplan-APOCHROMAT 100x/0.95
Carl Zeiss MicroImaging GmbH, Light Microscopy, Göttingen, Germany |
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 | | Microhardness impression in a maraging steel
Brightfield
EC Epiplan-NEOFLUAR, 50x/0.80
Sébastien Reymann, University of Applied Sciences, Materials Engineering Working Group, Aalen, Germany |
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 | | Magnetic domains on a silicon-iron electrical sheet
Kerr microscopy
EC Epiplan-NEOFLUAR 20x/0.50
Dr. Rudolf Schäfer, Leibniz Institute for Solid State and Materials Research Dresden, Germany |
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 | | AlNi3,5 anodized according to Barker
Polarization contrast
EC Epiplan-NEOFLUAR 20x/0.50
ACCESS e.V. Aachen and Foundry Institute of RWTH Aachen University, Germany |
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 | | Maraging steel recast structure, nital etch with white, unetched areas
Differential Interference Contrast EC Epiplan-NEOFLUAR, 50x/0.80
Sébastien Reymann, University of Applied Sciences, Materials Engineering Working
Group, Aalen, Germany |
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 | | Structure of the surface of a furniture wood
Darkfield
EC Epiplan- APOCHROMAT 10x/0.30
Carl Zeiss MicroImaging GmbH, Light Microscopy, Göttingen, Germany |
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 | | Insulation trench on a monocrystalline silicon solar cell
Brightfield
EC Epiplan-APOCHROMAT 20x/0.6
Carl Zeiss MicroImaging GmbH, Light Microscopy, Göttingen, Germany |
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The Applications - Opaque or Transparent
The range of materials and samples encountered in quality control, materials testing and research is vast. Axio Imager 2 offers the perfect solution for performing analyses. Metallic structures, composites, glass, wood and ceramics can be analyzed just as effectively as polymers, liquid crystals or semiconductor-based MEMs, wafers and photovoltaic elements, for example.
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| The sample space can be adjusted continuously for sample heights from 0 to 63 mm. |
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The Sample Area - From Just a Few µm to 63 mm in Height
You can adjust the sample space individually to suit your particular sample. The size can be adjusted within wide ranges, depending on the configuration. If you are using a reflected light stage support in combination with a reflected light stage, it is possible to examine samples of up to 63 mm in height, while with a transmitted light stage support and transmitted light stage a height of 45 mm can be achieved.
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