Multiple Stack Scan
 
Mosaic of Highly Resolved Details back
 
Definition
The Multiple Stack Scan (MXYZ) uses a correlation technique to assemble perfectly overlapping image stacks (XYZ) into an extra-large superstack that presents the topography of a large surface with high resolution.
 
Stack_Scan
Certified ceramic ball, Multiple Stack Scan from 10x10 single stacks. EC Epiplan-Neofluar 20x/0,5, 4.128 mm x 4.128 mm x 0.379 mm, 1165 x 1165 pixels x 380 slices.
 
Dimension
Scanning range extension: XY * 830 (with Scan Zoom 1)
Total measuring time: 0-24 hours
Maximum data format: 218,951,209 data points x 2,000 slices*
 
Application
- Acquisition of highly resolved, large-area topographies of   structured material surfaces
- Non-contact 3D roughness and waviness analyses
 
 
* Maximum size of the total data record: limited to 2 GByte.