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| There are many ways to describe a surface |
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It's not always the shortest path that leads to the desired goal.
There may be obstacles along the way.
Often, detours lead to decisive turns,
or to starting points for new approaches.
Don't be satisfied with plain, regular microscopy.
Scan regions of interest only.
Steer around impurities that are not really representative of the entire sample.
Adapt your scanning format to the measuring job at hand:
- Point Scan (P)
- Line Scan (X, rotated)
- Spline Scan (X, freehand line)
- Profile Scan (XZ, rotated)
- Image (XY, rotated)
- Image Stack (XYZ)
- Tile Scan (MXY)
- Time Series (Pt, XZt, XYt, XYZt)
- Multiple Profile Scan (MXZ)
- Multiple Stack Scan (MXYZ)
LSM 700:
We have the scanning mode appropriate for your surface.
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