| |
| All Relevant Contrast Methods Integrated |
| |
All methods offered in one and the same stand.
Simple oblique illumination, differential interference contrast (DIC), and – integrated for the first time – Dodt gradient contrast, all selectable by mere switching without any extra effort.
This gives you the flexibility to quickly respond to the nature of your specimen and choose the method providing optimum visibility.
 |
Purkinje cells in the cerebellum of a mouse, IR Dodt Gradient Contrast.
F. Kirchhoff, Max-Planck-Institute for experimental medicine, Göttingen, Germany |
| |
Even with the simplest contrast method,
Axio Examiner sets new standards.
Oblique illumination at no extra cost or effort is a standard feature integrated in every condenser that has a modulator wheel. Due to the 360° rotatabilty of the segment diaphragm the orientation of the shadow can easily be matched with that of the different specimen structures.
Dodt gradient contrast
Compared to contrast methods using polarized light (DIC) as well as to oblique illumination, the proprietary Dodt gradient contrast offers several advantages for the examination of thick brain sections, which scatter light to an extreme degree.
What you get is higher resolution and improved contrast, which improves the visibility of structures at greater tissue depths. The method needs no higher-cost polarizing components.
Carl Zeiss has designed an adapter which directly integrates this attractive method into the microscope in the form of a slider. Dodt gradient contrast with 360° segment rotation can thus be completely controlled from the front of the microscope, without interfering with pipettes and other attachments.
 |
The principle of Dodt gradient contrast: The arrangement of a special segment diaphragm and a diffusion disk reduces scattered light in the specimen, while not completely suppressing any parts of the illuminating light. As a consequence, imaging artefacts are avoided, and excellent results can be achieved with thick, extremely light-scattering specimens. |
| |
Differential interference contrast (DIC)
With thinner or less light-scattering specimens, DIC supplies unexcelled image results. On Axio Examiner, the method has been implemented in the Sénarmont version. Contrast setting is not performed with the DIC slider above the objective but on the polarizer below the condenser, i.e. the controls are remote from the critical specimen space.
VIS or IR?
All methods are available with visible or infrared light.
| |
|