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| Observing in New Dimensions |
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New imaging options improve the visualization of your samples. The developments we make at Carl Zeiss lead to new discoveries in research and more reliable testing and results. This applies not only to standard, but also, in particular, to sophisticated contrasting techniques, like the innovative C-DIC method. Axio Imager 2 will clearly enable you to enhance your results.
Test structures, period 1.6 µm
EC Epiplan-APOCHROMAT 50x/0.95, ∞/0, camera-adapter 0.63x
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| Before: If the rules according to Köhler are not precisely followed only inferior contrast images are possible, even with the best objectives. | After: ADF – Advanced Darkfield from Carl Zeiss. The result speaks for itself. |
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Contrasting - Competence in All Contrasting Techniques
Additional information helps you to make decisive advances. You can choose from a variety of contrasting techniques to achieve optimum optical quality for your applications: in reflected light it is possible to observe your samples in brightfield, darkfield, Differential Interference Contrast (DIC), Circular Differential Interference Contrast (C-DIC), polarization or fluorescence contrast, while in transmitted light, you can examine your samples in brightfield, darkfield, Differential Interference Contrast (DIC), polarization or circular polarization.
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Brightfield and Darkfield - Maximum Homogeneity and a Stray Light Free Image Background
In brightfield the Axio Imager 2 provides homogeneous illumination and exceptional contrast while, in darkfield, the background is so dark that the technique has earned a new name: ADF – Advanced Darkfield. By minimizing disturbing stray light and reducing the longitudinal color aberration of the illumination optics, this darkfield is suitable for the most challenging of samples and impresses even when faced with the finest of structures. Switching between techniques only requires a simple turn. The motorized stand models allow you to work particularly quickly and conveniently.
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C-DIC - Perfect for All Structures
Circular Differential Interference Contrast (C-DIC) is a polarization- optical technique which, in contrast to ordinary Differential Interference Contrast (DIC), uses circularly polarized light. This technique has a number of decisive advantages for the contrasting of differently aligned object structures. The specimen no longer has to be rotated for best image contrast and quality, as is the case in basic DIC. With C-DIC it is simply enough to adjust the position of the C-DIC prism to adjust for best image quality whether it is for contrast and/or resolution independent of ample orientation. And all this is possible using one C-DIC prism for a homogeneous unsurpassed quality image.
Topics
Cast Iron with Spherulitic Graphite, Polished. Images: Same Position and Same Magnification, but with Different Contrasting Techniques.
Specimen preparation and image interpretation: Dr. H.-L. Steyer, Kesselsdorf, Germany
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Classic brightfield allows you to identify only the spherulitic formation.
Matrix: white (bright), graphite: black (dark). |
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 | | Darkfield:
Unevenness in the polished surface (such as grooves of the phase boundaries between graphite and matrix or notches) clearly reveals the shape of the spherulites and thus the polishing quality. Structural features within the cut spherulites can be identified. Starting from the crystallization nucleus, the cut surfaces of the graphite segments become visible in their divergent orientation (preferred direction of crystallization). Incomplete polished spherulites contain bright points and more extensive bright areas. |
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 | | Circular Differential Interference Contrast (C-DIC):
The matrix is contrasted on the basis of the polishing relief. Hard and soft structural constituents become visible, as does what remains of the polishing striae (exclusively mechanically polished). |
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 | | Polarization (crossed polars):
The optical activity, in particular anisotropy, makes the structure inside the spherulites clearly visible. |
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 | | Polarization with Additional Lambda Compensator:
This technique allows optimal contrasting of the structure inside the spherulite section. The interference colors make it possible to see even more details than with simply crossed polars. |
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