Int'l Symposium for Testing & Failure Analysis (ISTFA)

Date
11/17/2009 - 11/18/2009

Location
San Jose/USA (San Jose/USA)

Exhibitor
Carl Zeiss MicroImaging

Don’t miss the industry’s premier event for microanalysis professionals.

Hear original, unpublished work on FA topics presented by industry professionals from around the world.

Attend technology-specific user groups.

Learn more and take advantage of educational short courses and maximize your ISTFA experience.

Do business and network at North America’s largest FA-related tradeshow.

For more information visit theISTFA website.