| |
Smart Particle Investigator (SmartPITM) is a powerful particle analysis package for use with Scanning Electron and Helium Ion Microscopes (SEM and HIM) from Carl Zeiss. It enables the automatic detection, investigation and characterisation of particles of interest.
 |
| X-ray analysis and chemical classification of filtered particles from manufacturing cleanliness monitoring in the automotive industry. |
| |
SmartPITM incorporates all aspects of the SEM control, image processing and Energy Dispersive X-ray (EDX) analysis for particle detection and characterisation within a single application. SmartPITMautomates repetitive sample analysis to provide non-subjective results with minimal user involvement and enables continuous unattended operation of the instrument.
Advantages of SmartPITM
- Ease of Use
- Auto-calibration and Self-diagnostic Procedures
- Morphological & Chemical Classification
- Border Particle Stitching
- Advanced Stop Criteria
- SmartPITM Reporter
- SmartPITM Explorer
| |
|