The NTS Division is a value adding integral part of Carl Zeiss developing, producing, selling and servicing SEM, TEM, and Particle Beam instruments designed to set unique high quality standards and to provide customer focused solutions for the Semiconductor, Material Analysis and Life Science application fields worldwide. Development and production facilities are based in Oberkochen (Germany), Peabody, MA (USA) and Cambridge (UK).
Our unique track record in E-Beam technology:
- First electrostatic TEM (1949)
- First commercial SEM (1965)
- First fully digital SEM (1985)
- First TEM with Koehler Illumination (1990)
- First TEM with imaging energy filter (1992)
- First Variable Pressure FE-SEM (2001)
- First 200kV FE EFTEM with Koehler Illumination (2003)
- First EFTEM with In-Column corrected Omega energy filter (2003)
- First CrossBeam® with dual In-Column detection system for simultaneous live SE/BSE imaging (2004)
- First to achieve 0.08 nm resolution with the 200 kV Cs corrected UHRTEM (2005)
- First 0.08 nm resolution with the 200 kV Cs corrected UHRTEM (2005)
- First Strategic Alliance with SIINT resulting in Award-winning NVision (2006)
- First He-Ion Microscope based on ALIS technology launched at M&M (2007)
- First FE-SEM with unique charge compensation called ULTRAplus (2007)
The company’s extensive know-how, which nowadays also comprises ion-beam technology and e-beam based analysis technology enable us to deliver innovative solutions for your business. Our global applications and service network guarantees fast, reliable and high quality support focussed on customer requirements. Combined with dedicated upgrade strategies, this will protect your investment for its entire lifetime. The core technology embedded in our innovative products enable us to provide solutions which add value to our customers’ business.
Enabling the Nano-Age World® |