Carl Zeiss SMT Inc.

Support Service Service Request Form Phone: (800) 233-3334 Sales Sales Contact Request Phone: (978) 826-1500 Applications & Training Demo/Training Request Application Notes Products Scanning Electron Microscopes CrossBeam (FIB-SEM) Systems Helium Ion Microscope Particle Analysis Systems Transmission Electron Microscopes See the AURIGA™ FIB-SEM!

Upcoming Events ISTFA Nov. 15-19, San Jose, CA Event details... MRS Fall Dec. 1-3, Boston, MA Event details... Register for a Demo... ASCB Dec. 6-8, San Diego, CA Event details... Training Courses SEM Training Workshops Irvine, CA Dec. 8-9, 2009 FESEM Feb. 9-10, 2010 EVO SEM Peabody, MA Dec. 15-16, 2009 EVO SEM Details & Registration

News Analysis of Shale Rock Carl Zeiss Partners with Ingrain to Enable Nanoscale Analysis of Hydrocarbon Deposits in Shale Rock Details... Brain Mapping Carl Zeiss Speeds Brain Mapping and 3-D Reconstruction with Advanced Electron Microscopy and Analysis Instruments Details... Correlative Microscopy Shuttle & Find – Bridging the Micro and Nano World Details Cs-Corrected STEM/TEM Read more.. New Resolution Record! Carl Zeiss sets a new resolution record for scanning electron and ion microscopy