Achieve spatial resolution down to 50 nm with ZEISS Xradia 810 Ultra X-ray microscope, the highest among lab-based X-ray imaging systems. Experience unparalleled performance and flexibility with the non-destructive 3D imaging that plays a vital role in today’s breakthrough research. The innovative Xradia Ultra architecture, with unique X-ray optics adapted from synchrotron technology, features absorption and phase contrast. Now with energy at 5.4 keV you can increase the throughput of your nanoscale imaging by up to a factor of 10. Achieve even better contrast and image quality for medium to low Z samples with the lower energy of Xradia 810 Ultra. Expect to accomplish advanced in situ and 4D capabilities for studying structural evolution over time and under varying conditions. Extend the limits of exploration with 3D X-ray imaging for materials research, life sciences, natural resources, and diverse industrial applications.
ZEISS solutions deliver the world’s only non-destructive 3D X-ray imaging with resolution down to 50 nm in a laboratory instrument. Along with both absorption and Zernike phase contrast, ZEISS Xradia 810 Ultra employs advanced optics adapted from the synchrotron to deliver industry-best resolution and contrast for your research. This innovative instrument enables breakthrough research by adding a critical, non-destructive step to your traditional imaging workflow.
By delivering higher contrast for your studies at 5.4 keV, Xradia 810 Ultra makes high-resolution X-ray imaging viable for a variety of difficult-to-image materials. Optimize your imaging with absorption and phase contrast for a diverse range of materials such as polymers, oxides, composites, fuel cells, geological samples and biological materials. Having pioneered nanoscale X-ray imaging at synchrotrons and prominent lab facilities worldwide, ZEISS XRM deliver ground¬breaking solutions to help put your studies at the forefront of research.
By making nanoscale X-ray imaging an order of magnitude faster, Xradia 810 Ultra optimizes the business case for XRM, whether your work is for science or industry. For central microscopy labs, a faster workflow translates into the ability to allow more users to leverage the instrument in less time, which in turn extends XRM to a broader base of subscribers. Similarly, you can quickly perform and repeat 4D and in situ studies of internal structures, making these techniques viable for many more applications. And if your applications are very targeted, such as digital rock physics used to explore feasibility of oil and gas extraction, Xradia 810 Ultra delivers measurements you can use to characterize critical parameters such as porosity within a matter of hours.
Optimize study and design of functional materials: batteries, fuel cells, catalysts, composites, construction materials. Obtain realistic 3D microstructure data to improve computational models for bottom-up design of materials. Study and predict material properties and nanostructural evolution. Examine materials for porosity, cracks, and phase distribution in hours rather than days. Use 3D mapping for deeper understanding of properties and behaviors: porosity/pore connectivity, fiber orientation, crack propagation, particle size/distribution, delamination. High resolution, non-destructive imaging facilitates 4D and in situ studies, with high contrast for medium to low Z materials.
Use nanoscale X-ray microscopy to determine structure of unconventional reservoir rock (carbonate, shale), obtaining parameters for characterization within hours (porosity, permeability) used in flow simulations to optimize extraction. Achieve nanoscale pore structure measurements faster by a factor of 10 for digital rock physics and special core analysis, significantly reducing time to results. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure.
Image soft and hard tissue: microtubules in dentin, osteocyte lacunae and canaliculi in bone, bioscaffolds for tissue engineering, nanoparticle agglomerations in organic materials.
Optimize your package development process through nanoscale visualization of semiconductor samples for electronics packaging research and development.
Understand nanostructural changes in 3D under load
ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.
How it works:
ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.
Observe deformation and failure of materials under uniaxial compressive load. Study elastic and plastic deformation and determine if the effects are uniform, anisotropic or localized relative to nanostructural features such as voids, struts or interfaces.
Observe deformation and failure of materials under uniaxial tensile load. Understand critical properties like elastic modulus and tensile yield strength and how they relate to the specific nanostructural features of the specimen.
In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.
The innovative ZEISS Scout-and-ScanTM Control System represents a significant usability and productivity improvement for Xradia Ultra. Scout-and-Scan streamlines sample and scan set-up to boost your productivity with Xradia Ultra.
The workflow-based user interface guides you through the process of aligning the sample, scouting for regions of interest, and setting up 3D scans. Recipes allow you to set up multiple scans of the same sample to image various regions of interest, or to combine different imaging modes. The easy-to-use system is ideal for a central lab-type setting where users may have a wide variety of experience levels.
ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.
Please fill out the form to receive information on Xradia products. The documentation will be emailed to the address you provide. Please make sure that you enter a valid email address.