chemical and physical analysis

Chemical and Physical Analysis

We offer a broad range of lab analysis services as well as surface analysis for your issues in the  optical and precision mechanical industries.

Tell us your analytical problem and we will present you with a customized order.

We offer the following individual services:

  • General instrumental analysis, polymer analysis and surface analysis including method development and validation
  • Analysis of application problems
  • Process optimization reviews (in-process analysis)
  • Cleaning process reviews
  • Contamination inspections
  • Material, auxiliary material and operating materials evaluations incl. incoming goods inspection for ensuring the availability of auxiliary and operating materials and supplies
  • Product reviews within the scope of quality assurance
  • Environmental analysis (waste water, air samples)
  • Cooperation with external labs


Our methods:

  • IR, UV/VIS and fluorescence spectroscopy
  • Ion chromatography (IC)
  • Thermal desorption - gas chromatography/ mass spectrometry (ATD-GC-MS)
  • Atomic emission spectroscopy (ICP-OES)
  • Electro-analytic procedures (potentiometry)
  • Light microscopy
  • Scanning electron microscopy, coupled with energy dispersive X-ray spectroscopy (REM/EDX)
  • X-ray photoelectron spectroscopy (XPS) – together with external partners
  • Secondary ion mass spectrometry (SIMS, TOF-SIMS) – together with external partners

Options of Chemical and Physical Analysis

The following table illustrates the possible parameters and procedures that are applied in our analyses.

Definition of Problem Parameters (Selection) Procedure Matrix Application
Backlog evaporation residue gravimetry liquids solvents for use with optics, cleaning baths
Anions fluoride, chloride, nitrate, sulphate, phosphate ion chromatography liquids cleaning baths, ultrapure water, contamination fittings
Airborne, Molecular Contamination solvents, additives, monomers, softeners, antioxidants, siloxanes thermal desorption, gas chromatography, mass spectrometry gases, solids interior air, organic contamination, gas room semiconductor lenses, gas lines; outgassing behavior of solid materials such as polymers, adhesives, cements, lacquers, plastics
Soluble Components extract content solid-liquid extraction solids quality inspection of optic auxiliary materials such as gloves, cotton wool for cleaning, cleanroom materials, plastics
Hazardous Substances flame point (Abel-Pensky method) liquids solvents, lacquers, polymer systems
Cations chromium, manganese, iron, nickel, copper, zinc, aluminum, lead etc. atomic emission spectroscopy, volumetry liquids, solids ultrapure water, waste water, cleaning baths, electroplating, metals, alloys
Cations sodium, potassium, magnesium, calcium, ammonium ion chromatography liquids cleaning baths, ultrapure water, contamination fittings, cleanroom materials
Organics cleanliness, impurities gas chromatography flame ionization detector liquids quality control of solvents for optics, general solvents
Organic Materials material characterization, cleanliness, identity infrared spectroscopy liquids, solids monomer quality control, polymers, optic auxiliary materials, damage analysis, surface contaminations
Acidity ph value potentiometry liquids cleaning baths, quality control, packing material
Freedom from Silicone silicone content infrared spectroscopy following extraction and reconditioning solids quality control of optic auxiliary materials, cleanroom materials
Freedom from Water water content Karl Fischer titration liquids solvents, polymer systems, cleaning baths
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Methods and Applications

The following table illustrates which information depth and resolution are possible with different methods of analysis.

Method Application Information Depth Lateral Resolution
Light Microscopy visual characterization, homogeneity, inclusions, pores, defects --- µm-mm
Scanning Electron Microscopy (SEM) material and surface inspections, structure, damages approx. 1 µm nm-µm
Energy/ Wavelength Dispersive X-ray (EDX, WDX) X-ray Photoelectron Spectroscopy qualitative and quantitative surface analysis, damages approx. 1 µm approx. 1 µm
X-ray Photoelectron Spectroscopy (XPS) / ESCA
qualitative and quantitative surface analysis, surface contamination, evaluation of cleaning processes, damages, interface inspection, depth profiles 3-5 nm (without depth profile) µm-mm
Secondary Ion Mass Spectrometry (SIMS) qualitative surface analysis, surface contamination, depth profile analyses, damage, interface inspection up to µm µm
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outgassing behavior of polyurethane tube with triphenyl phosphate as flame retardant material

Example: Outgassing behavior of polyurethane tube with triphenyl phosphate as flame retardant material.

Implementation of SIMS

Example: Successful implementation of SIMS for identification of metallic contaminations (Cr, Ni) on the optic material – antireflective coating interface.