By incorporating easy-to-use ZEISS optics into the otherwise traditional X-ray CT design, sub-micron resolution is achievable. Unlock new degrees of versatility for your scientific and industrial research with the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family. Building on industry-best resolution and contrast, the ZEISS Xradia 620 Versa expands the boundaries of your non-destructive X-ray imaging at the sub-micron scale.
- Visualize the smallest defects in Li-Ion batteries at sub-micron resolutions without destroying the sample
- Obtain comprehensive 3D microstructure analysis from large volumes down to local individual grain boundary analysis via Diffraction Contrast Tomography
- Image an additive manufactured part to find unmelted particles, high density inclusions and small voids