Expanding the Boundaries of CT: X-Ray Microscope Imaging at Sub-Micron Resolution

Thursday, 28th May 2020 | 10:00 - 11:00 am (CDT)

By incorporating easy-to-use ZEISS optics into the otherwise traditional X-ray CT design, sub-micron resolution is achievable. Unlock new degrees of versatility for your scientific and industrial research with the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family. Building on industry-best resolution and contrast, the ZEISS Xradia 620 Versa expands the boundaries of your non-destructive X-ray imaging at the sub-micron scale.

Highlights of this webinar:

  • Visualize the smallest defects in Li-Ion batteries at sub-micron resolutions without destroying the sample
  • Obtain comprehensive 3D microstructure analysis from large volumes down to local individual grain boundary analysis via Diffraction Contrast Tomography
  • Image an additive manufactured part to find unmelted particles, high density inclusions and small voids

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