This free event is perfect for individuals interested in learning about the capabilities of ZEISS Metrology Services and our CT inspection with the METROTOM OS 3.2 and how it relates to mixed material analysis. See how it generates a highly precise, 3D image of a workpiece, which enables measurements at any location.
Roger Wende, North American Manager from Volume Graphics Inc. will present on VGStudioMAX 3.0. He'll share some of the new features in this latest version and how it helps analyze CT datasets. Mark Foster from Applied Geometrics, Inc. will also provide two sessions on GD&T training. Take in both sessions during your visit.
Doors will be open from 9am-4pm. All attendees will receive 30% off their next Metrology Services order and will be entered into a drawing to win a pair of ZEISS TERRA ED binoculars.