Aluminum Samples

Supporting your research

Connected Microscopy for intelligent analysis

ZEISS solutions can help you extract information from metals samples on scales from the millimeter to the nanometer, whether imaging and measuring features, chemical and crystallographic analysis of inclusions, grains and phases, or textural and structural information in three imensions, in turn meeting the needs of your customers and our world. 

By advancing the microscopy spectrum, ZEISS can help you advance metals with a full multiscale portfolio of light, electron, X-ray and ion beam microscopes for routine and research applications, with an industry-leading suite of software solutions. These will unlock your information in light, electrons, and materials. 

  • Digital Toolkit for Metals Characterization
  • Rapid Sample Preparation
  • Evaluating 3D Grain Structure

Microstructural analysis of metals

bringing deep physical & chemical understanding of properties and performance

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ZEISS Microscopy Solutions for Metallography research
Multi-modal characterization and advanced analysis options for industry and research

Multi-modal characterization & advanced analysis options

For industry and research

Learn how ZEISS can help you advance metals with a full multiscale portfolio of light, electron, X-ray and ion beam microscopes for routine and research applications.

Rapid Sample Preparation for EBSD-analysis

Rapid Sample Preparation

for EBSD-analysis
enabled by the LaserFIB

Read here how the new femtosecond laser for ZEISS Crossbeam is used to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.

Enabling Premium 3D Crystallographic Imaging

Premium 3D Crystallographic Imaging

in Your Laboratory Laboratory-based Diffraction Contrast Tomography

Learn more about the latest capabilities of laboratory-based DCT on 3D X-ray imaging systems, and new research and 3D characterization capabilities this enables.

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Advance your metallography research

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