ZEISS Axio Vert.A1 for Materials
Product

ZEISS Axio Vert.A1

Inverted Routine Microscope for Materials

Gain insights into large and heavy materials samples with ZEISS Axio Vert.A1, your compact, inverted microscope. Benefit from using a wide range of contrast methods and combine them to achieve a maximum amount of information. Take advantage of the encoded nosepiece turret that recognizes a change of objectives automatically. A light manager lets you save and recover light intensity values. Quantify your samples’ microstructure efficiently. Evaluate the properties and quality of your materials. Use these insights e.g., to optimize production processes.

  • Fast imaging with a wide range of objectives
  • Contrast methods for all details
  • Reproducible measuring and comparing
Fast Imaging with a Wide Range of Objectives

Fast Imaging with a Wide Range of Objectives

For your applications you need a variety of objectives. Select the appropriate magnification at all times with the 5x encoded nosepiece turret. Save time and eliminate sources of error: the encoding allows Axio Vert.A1 to automatically recognize your objective.

Axio Vert.A1 provides all common contrast methods: the 4x reflector turret switches quickly and easily in reflected light between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast, allowing you to examine anisotropic materials such as magnesium and aluminum. Switch to transmitted light illumination and you work with brightfield, polarization or phase contrast.

Contrast Methods for All Details

Axio Vert.A1 provides all common contrast methods: with the 4x reflector turret you switch quickly and easily in reflected light between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast, allowing you to examine anisotropic materials such as magnesium and aluminum. Switch to transmitted light illumination and work with brightfield, polarization or phase contrast.

Reproducible Measuring and Comparing

Reproducible Measuring and Comparing

Gain a quick, comprehensive overview of your sample at first sight using the field of view of 23°. Use reticles and structure comparison disks for measuring and counting. In addition, ZEISS ZEN core offers you a powerful range of modules such as grain size, phase analysis, layer thickness and interactive measurement for your investigations.

Downloads

    • Axio Vert.A1 for Materials

      Microstructural and Structural Analysis: A Question of Contrast

      Pages: 14
      File size: 7 MB
    • ZEISS Microscopy Solutions for Steel and Other Metals

      Multi-modal characterization and advanced analysis options for industry and research

      Pages: 11
      File size: 14 MB
    • Microscope and Measurement Systems for Quality Assurance and Quality Control

      Capture the essentials of your component. Quickly. Simply. Comprehensively.

      Pages: 41
      File size: 4 MB
    • Axio Vert.A1

      Instruction Manual (English)

      Pages: 111
      File size: 5 MB

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