![]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.100.33.file/solution-lab-wallpaper-1.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.360.120.file/solution-lab-wallpaper-1.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.768.256.file/solution-lab-wallpaper-1.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1024.341.file/solution-lab-wallpaper-1.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1280.427.file/solution-lab-wallpaper-1.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1440.480.file/solution-lab-wallpaper-1.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original./solution-lab-wallpaper-1.jpg"})
Laboratoire de solutions ZEISS
Développement rapide d'applications
Choisissez votre domaine d'application
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Système d'amélioration du contraste de phase ZEISS pour XRM
Du Laboratoire de solutions pour la production de pièces en métal
Supprimez les artefacts de phase par une modélisation explicite de l'artefact, puis par sa déconvolution en 3D sur un volume entier.
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Analyseur de poudre pour la fabrication additive ZEISS
Du Laboratoire de solutions pour la production de pièces en métal
Un seul clic suffit pour passer de volumes 3D, obtenus à partir de données brutes, à une analyse complète des résultats.
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ZEISS DeepRecon pour la reconstruction par rayons X
Du Laboratoire de solutions pour un rendement multiplié par 10
Pour les microscopes à rayons X ZEISS Xradia pour les processus répétitifs.
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ZEISS processus de Calotte Grinding
Du Laboratoire de solutions pour les revêtements, les films et les surfaces
Déterminer la résistance à l'usure des films et des surfaces.
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ZEISS Total Interference Contrast (TIC) pour la mesure de couches minces
Du Laboratoire de solutions pour les revêtements, les couches minces et la rugosité
Mesure de la hauteur sans contact avec un microscope optique.
![Système d'amélioration du contraste de phase ZEISS pour XRM]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.100.56.0,139,662,511.file/ppcf_rawdata.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.360.203.0,139,662,511.file/ppcf_rawdata.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg"} "Système d'amélioration du contraste de phase ZEISS pour XRM")
![Analyseur de poudre pour la fabrication additive ZEISS]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.100.56.36,0,1885,1040.file/ampa_1.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.360.203.36,0,1885,1040.file/ampa_1.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.768.432.36,0,1885,1040.file/ampa_1.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1024.576.36,0,1885,1040.file/ampa_1.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1280.720.36,0,1885,1040.file/ampa_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1440.810.36,0,1885,1040.file/ampa_1.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1849.1040.36,0,1885,1040.file/ampa_1.jpg"} "Analyseur de poudre pour la fabrication additive ZEISS")
![ZEISS DeepRecon pour la reconstruction par rayons X]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.100.56.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.360.203.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.768.432.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1024.576.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png"} "ZEISS DeepRecon pour la reconstruction par rayons X")
![ZEISS processus de Calotte Grinding]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.100.56.32,0,1396,767.file/calotte_grinding.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.360.203.32,0,1396,767.file/calotte_grinding.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.768.432.32,0,1396,767.file/calotte_grinding.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1024.576.32,0,1396,767.file/calotte_grinding.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1280.720.32,0,1396,767.file/calotte_grinding.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png"} "ZEISS processus de Calotte Grinding")
![ZEISS Total Interference Contrast (TIC) pour la mesure de couches minces]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.100.56.0,3,2456,1385.file/tic-crosssection.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.360.203.0,3,2456,1385.file/tic-crosssection.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.768.432.0,3,2456,1385.file/tic-crosssection.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1024.576.0,3,2456,1385.file/tic-crosssection.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1280.720.0,3,2456,1385.file/tic-crosssection.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1440.810.0,3,2456,1385.file/tic-crosssection.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,3,2456,1385.file/tic-crosssection.jpg"} "ZEISS Total Interference Contrast (TIC) pour la mesure de couches minces")
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Système d'amélioration du contraste de phase ZEISS pour XRM
Du Laboratoire de solutions pour la production de pièces en métal
Supprimez les artefacts de phase par une modélisation explicite de l'artefact, puis par sa déconvolution en 3D sur un volume entier.
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Analyseur de poudre pour la fabrication additive ZEISS
Du Laboratoire de solutions pour la production de pièces en métal
Un seul clic suffit pour passer de volumes 3D, obtenus à partir de données brutes, à une analyse complète des résultats.
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ZEISS processus de Calotte Grinding
Du Laboratoire de solutions pour les revêtements, les films et les surfaces
Déterminer la résistance à l'usure des films et des surfaces.
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ZEISS Total Interference Contrast (TIC) pour la mesure de couches minces
Du Laboratoire de solutions pour les revêtements, les couches minces et la rugosité
Mesure de la hauteur sans contact avec un microscope optique.
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ZEISS processus de Dendrite Arm Spacing
Du Laboratoire de solutions pour la mesure de distance entre bras dendritiques à l'aide de la microscopie optique
Automatisation combinée grâce au traitement d'images et à la possibilité d'un réglage fin manuel.
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ZEISS processus de Point Counting
Du Laboratoire de solutions pour la microscopie optique
Déterminez la fraction volumique estimée d'un constituant ou d'une phase d'intérêt donnée dans un échantillon.
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ZEISS processus de Microhardness
Du Laboratoire de solutions pour les métaux
Le processus de Microhardness permet de réaliser des tests métallurgiques visant à déterminer la dureté d'un métal.
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ZEISS processus de Calotte Grinding
Du Laboratoire de solutions pour les revêtements, les films et les surfaces
Déterminer la résistance à l'usure des films et des surfaces.
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ZEISS processus de Pseudo 3D Micrograph
Du Laboratoire de solutions pour créer des visualisations de structures 3D à partir d'images 2D
Du Laboratoire de solutions pour créer des visualisations de structures 3D à partir d'images 2D
![ZEISS processus de Dendrite Arm Spacing]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.100.56.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.360.203.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.768.432.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1024.576.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1280.720.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg"} "ZEISS processus de Dendrite Arm Spacing")
![ZEISS processus de Point Counting]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.100.56.30,0,1402,772.file/point-counting.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.360.203.30,0,1402,772.file/point-counting.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.768.432.30,0,1402,772.file/point-counting.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1024.576.30,0,1402,772.file/point-counting.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1280.720.30,0,1402,772.file/point-counting.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png"} "ZEISS processus de Point Counting")
![ZEISS processus de Microhardness]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.100.56.0,31,1428,834.file/microhardness.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.360.203.0,31,1428,834.file/microhardness.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.768.432.0,31,1428,834.file/microhardness.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1024.576.0,31,1428,834.file/microhardness.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1280.720.0,31,1428,834.file/microhardness.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png"} "ZEISS processus de Microhardness")
![ZEISS processus de Pseudo 3D Micrograph]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.100.56.0,60,640,420.file/pseudo-3d_micrograph-1.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.360.203.0,60,640,420.file/pseudo-3d_micrograph-1.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png"} "ZEISS processus de Pseudo 3D Micrograph")
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Analyseur de libération et d'exposition de surface ZEISS
Du Laboratoire de solutions pour l'analyse de l'exposition de surface en 3D dans le secteur de l'exploitation minière
Analyses automatisées particule par particule de la surface et de la libération 3D pour l'industrie minière.
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ZEISS processus de Point Counting
Du Laboratoire de solutions pour la microscopie optique
Déterminez la fraction volumique estimée d'un constituant ou d'une phase d'intérêt donnée dans un échantillon.
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ZEISS processus de Grain Size Color Map
Du Laboratoire de solutions pour la visualisation de la distribution granulométrique.
Du Laboratoire de solutions pour la visualisation de la distribution granulométrique.
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ZEISS processus de Pseudo 3D Micrograph
Du Laboratoire de solutions pour créer des visualisations de structures 3D à partir d'images 2D
Du Laboratoire de solutions pour créer des visualisations de structures 3D à partir d'images 2D
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ZEISS DeepRecon pour la reconstruction par rayons X
Du Laboratoire de solutions pour un rendement multiplié par 10
Pour les microscopes à rayons X ZEISS Xradia pour les processus répétitifs.
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Projecteur ZEISS à biréfringence maximale
Du Laboratoire de solutions pour la minéralogie par microscope optique
Processus de classification des minéraux sur la base de la microscopie optique pétrographique automatisée.
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