In Situ Lab for Your ZEISS FE-SEM

Integrated Solution for Your Multi-modal in situ Experiments

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Simple and fast experiment setup
Operate with ease & enjoy customer-friendly application due to simple hardware integration and controlling all system components from a single workstation
Increase your productivity
Benefit from automated in situ workflows for highly reproducible, accurate and reliable operator-independent data acquisition
Achieve high quality data
Obtain high-quality data for reliable post-processing, such as strain mapping using Digital Imaging Correlation (DIC), supported by GOM
Expand your post-processing capabilities
Data post-processing and management provides you with broad application and variability. Investigate materials such as metals, alloys, polymers, plastics, composites, and ceramics with this fully integrated In Situ Lab

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Speak to Our Scanning Electron Microscopy Experts

Get in touch with us to get to know how the new In Situ Lab for ZEISS FE-SEM benefits your specific research challenges or facility, book a demo at our customer center, or get a quote. We are looking forward to hearing from you.

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In Situ Lab for ZEISS FE-SEM

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