ZEISS Microscopy

New approaches for high resolution secondary ion mass spectroscopy (SIMS)

Thanks for participating our Webinar on November 28th

ZEISS invites you to a webinar on Compositional analysis at all length scales for our Secondary Ion Mass Spectroscopy (SIMS) portfolio by Antonio Casares and Peter Gnauck on 28 November 2019 at 7 PM GMT (1 PM CST | 4 PM BRT).

Key Learnings:

  • Gain an overview about the high-resolution SIMS Technology and potential applications
  • Learn how to acquire Correlative Electron Microscopy Images with SIMS
  • Discuss Nanoparticle Analysis, Bioimaging and Nanopatterning with our experts 

Watch the Webinar Recording

Speaker Profiles

Dr. Antonio Casares

Antonio Casares is Director of Sales and Business Development forEMEA-LA at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.

Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree in “Charded Partical Optics” with Prof. Wollnik, followed by post-doctoral work at the Max Planck Institute in Göttingen, Germany and the Oak Ridge National Laboratory in the USA as “Instrument Scientist” before he joined Carl Zeiss Microscopy division in 2002.

Dr. Peter Gnauck

Dr. Peter Gnauck is Senior Manager of Business Development for EMEA-LA at ZEISS Research Microscopy Solutions in Germany and responsible for the Helium Ion Microscopy Business. He has more than 20 years of experience in the design and construction of ion and electron microscopes and a deep application knowledge in those techniques.

Peter holds a diploma in Physics from the University of Tuebingen, Germany, where he also earned his doctor’s degree in Physics (electron and ion optics). Followed by work as a research scientist at the NMI in Reutlingen, Germany before he joined Carl Zeiss Microscopy division in 1999.

Abstract

Modern microscopy labs are typically outfitted with a suite of instruments, capable of capturing data across a range of length scales in 2D- and 3D, from the centimeters to the sub-nanometers. These imaging instruments are often complimented by analytical techniques, such as spectroscopic chemical characterization platforms or mass spectrometry and are designed to produce a comprehensive depiction of the material under investigation.

ZEISS as a leading supplier of electron and ion optical systems offers an extended Secondary Ion Mass Spectroscopy (SIMS) portfolio for compositional analysis at all length scales.

The webinar will give an overview of the current state of high-end SIMS technology, its potential application space and the challenges in correlating different microscopy modalities.