- Learn about two of the latest additions to ZEISS FIB-SEM portfolio: ZEISS Crossbeam laser and the ToF-SIMS add-on
- Learn how ZEISS Crossbeam laser is a unique solution for large-scale sample preparation and sub-sequent analysis in the FIB-SEM
- Gain an overview about the high-resolution SIMS technology from ZEISS and potential applications
The LaserFIB combines an ultra-short pulsed laser, typically a femtosecond (fs) laser, and a FIB-SEM, all in one microscope. Massive material ablation by the laser allows to gain rapid access to structures buried deeply in e.g. packaged electronics or display devices. The targeted regions of interest can then be analyzed by FIB-SEM. Remarkably, sample damage or heat effects induced by the laser are minimal. Thus, the LaserFIB is attracting attention also in the field of materials engineering and characterization, e.g. for the fabrication of micromechanical testing devices with dimensions of up to millimeters or large cross sections for EBSD.
As a leading supplier of electron and ion optical systems ZEISS offers a state of the art Secondary Ion Mass Spectroscopy (SIMS) technology for compositional and Isotopic analysis. The webinar will give an overview of the high-end SIMS technology and its potential application space.
Fabián Pérez Willard
Fabián Pérez Willard manages ZEISS ion microscopy solutions for Materials Research. He is based in Oberkochen, Germany. Fabián studied physics at the Karlsruhe Institute of Technology (KIT). There he completed a PhD in low-temperature physics 2003.
After heading a multiuser service lab facility with focus on the fabrication and characterization of functional nanostructures at KIT, Fabián moved to ZEISS in 2006. At ZEISS he has held different positions in applications, product management and marketing. He has 20+ years of experience in electron microscopy and is an expert in the field of ion microscopy.
Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques. Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree in “Charged Partical Optics” with Prof. Wollnik, followed by post-doctoral work at the Max Planck Institute in Göttingen, Germany and the Oak Ridge National Laboratory in the USA as “instrument scientist” for mass spectrometry before he joined ZEISS Microscopy in 2002.