- Learn how ion microscopy leads to new insights into the world of nanomaterials,
- Explore the technology behind it working with the helium and neon ion beam,
- Discuss with our expert the broad range of applications from solar cells until nanoparticles.
Current trends in nanotechnology as 2D materials, plasmonic devices and quantum computing require highest imaging and patterning performance. Especially high resolution surface sensitive imaging and the fabrication of gallium free sub 10 nm nanostructures represent a major challenge for state of the art SEM and FIB systems.
Combining a high brightness Gas Field Ion Source (GFIS) with unique sample interaction dynamics, the helium ion microscope (HIM) provides images offering unique contrast and complementary information in comparison to existing charged particle imaging instruments such as the SEM and TEM. Formed by a single atom at the emitter tip, the helium probe can be focused to below 0.25 nm offering the highest recorded resolution for secondary electron images. The small interaction volume between the helium beam and the sample also results in images with stunning surface detail. In addition to helium, the GFIS can be operated also with neon. Both ion beams can be used for fabricating nanostructures at the sub 10 nm length scale. The neon beam enhances the capabilities of the HIM towards high resolution analytical techniques like SIMS. By adding a magnetic sector mass spectrometer, the ion microscope is extended to a high resolution analytical instrument providing a lateral resolution in SIMS mode below 15 nm.
We will show several application studies including solar cells, lithium ion batteries, nanoparticles and life sciences applications as well as multimodal correlative approaches.
This webinar will cover the technology behind the HIM, image formation and imaging examples for materials science and life sciences applications, nanopatterning with helium and neon ions to create plasmonic resonators as well as high resolution SIMS nanoanalytics.
Dr. Peter Gnauck
Dr. Peter Gnauck is business development manager at ZEISS Research Microscopy Solutions in Germany and responsible for the helium ion microscopy business. He has more than 20 years of experience in the design and construction of ion and electron microscopes and a deep application knowledge in those techniques.
Peter holds a diploma in physics from the University of Tuebingen, Germany, where he also earned his doctor’s degree in physics (electron and ion optics). Before he joined ZEISS Microscopy in 1999, he worked as a research scientist at the NMI in Reutlingen, Germany.