- ZEISS MultiSEM – the fastest electron microscope in the world
- Multi-beam scanning electron microscopy enables high-throughput imaging
- Large-scale experiments beyond today’s imagination
Studies of the brain’s connectivity fundamentally require characterization of a range of dimensions because the structures of interest often span many length scales, from the macroscale down to the nanoscale. Various other fields of research alike need to deal with the challenge to bridge this gap of simultaneous high throughput and high resolution microscopy.
The ZEISS MultiSEM family employs multiple, parallel electron beams in a single instrument to increase the field of view per imaging event while maintaining the spatial resolution afforded by precision electron optics. Details of the technology as well as an overview of application examples will be provided.
Dr. Anna Lena Eberle
Anna Lena Eberle is a product manager at Carl Zeiss MultiSEM GmbH in Germany. As a neurobiologist, she has experience with, and trained people on various microscope techniques and is always fascinated by the different aspects becoming visible within the same subject when examined with another method. Anna studied biology at the University of Tübingen, Germany, and she completed her doctoral thesis in the Neurosciences at the Max-Planck-Institute for biological cybernetics. For the past 8 years she has been part of the team that developed the first commercial multi-beam scanning electron microscope, namely ZEISS MultiSEM.
Dr. Antonio Casares
Antonio Casares is a sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in the related techniques for this equipment. Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree in “Charged Particle Optics” with Prof. Wollnik, followed by post-doctoral work at the Max Planck Institute in Göttingen, Germany and the Oak Ridge National Laboratory in the USA as an Instrument Specialist for mass spectrometry before he joined ZEISS Microscopy in 2002.