ZEISS Microscopy

Opportunities in 3D and 4D imaging
with Laboratory X-ray Microscopy

April 2nd | 10 - 11 am CET

ZEISS invites you to a webinar on Opportunities in 3D and 4D imaging with Laboratory X-ray Microscopy.

Join our speaker Nicolas Gueninchault on April 2nd at 10 AM CET.

Key Learnings:

  • Learn what differentiates X-ray microscopy from other 3D X-ray imaging techniques
  • Discover new opportunities to study material’s microstructure with unique imaging modalities
  • Expand your horizon with our correlative microscopy capabilities


In recent years, X-ray microscopy (XRM) has grown out of origins at synchrotron facilities and set new benchmarks in high resolution, nondestructive 3D characterization. With 3rd and now 4th generation synchrotrons, and accompanied by exponential improvements in both processing power and beam quality, recent progress at these tomography beamlines has been made possible, in pushing forward the science. Furthermore, an expansion in the variety of imaging/spectroscopy modalities has created increasingly rich and descriptive data sets, with new integrated correlative imaging workflows.

Many of these techniques have also translated to a broader community via analogous lab-based machines. Through incorporating synchrotron-style optics, lab-based XRM systems can now achieve comparable levels of resolution and contrast, moving CT beyond an inspection/NDT technique and well into the scientific realm. Also similarly to the synchrotron, in situ imaging in the lab has become more prevalent as well, albeit at a different time scale. It has been demonstrated now that, for some specific experiments, lab systems can actually be more suitable Lastly, the classical absorption tomography of CT or microCT is being supplemented with an increasing range of modalities available on lab XRM systems, most notably and recently that of diffraction contrast tomography (DCT).

This presentation will explore these emerging laboratory-based methods, namely in situ and diffraction contrast tomography, and provide examples of their application in materials science along with an expansion of the classic “single-instrument” microscopy to correlative approaches making the link between XRM and 3D SEM.

Speaker Profiles

Nicolas Gueninchault

Nicolas holds a M.E. from the Université of Marne la Vallée and a PhD. from Paris Sciences et Lettres University (Paris), both in Mechanics. Following his doctoral studies on the observation and the simulation of grain bulk crystal plasticity, he joined the Copenhagen based startup Xnovo Technology as an application scientist, where he has participated in the development of the LabDCT module, which enables crystallographic imaging with laboratory instruments. Since 2019, he as joined Zeiss as the Product and application specialist for the EMEA-LATAM region, specialized in X-ray microscopy instruments for Zeiss’ Research and Microscopy Solutions segment.

Watch the webinar recording