November 10, 10:00 – 12:30 CET

From nano to macro in femtoseconds.

Seminar on ZEISS Crossbeam laser with ToF-SIMS

Everything in one instrument – the LaserFIB, ZEISS Crossbeam laser, equipped with a ToF-SIMS detector – combines an ultra-short, pulsed laser, a femtosecond laser, a FIB-SEM and a time-of-flight Secondary Ion Mass Spectrometer (SIMS).

Massive material ablation by the laser allows to gain rapid access to structures buried deeply in e.g. packaged electronics or display devices. The targeted regions of interest can then be analyzed by your ZEISS FIB-SEM with ToF-SIMS for compositional analysis at all length scales. At the same time, the sample damage or heat effects induced by the laser are minimal, attracting the attention of engineering and characterization, e.g. for the fabrication of micromechanical testing devices with dimensions of up to millimeters or large cross-sections for EBSD.

Finally, the femtosecond laser analysis followed by ToF-SIMS is an air-free integrated workflow with such instrument.

The seminar will give you an overview of the current state of the high-end technolgy of ZEISS Crossbeam laser with ToF-SIMS, its application possibilities, and solving the challenges of correlating different microscopy modalities.

Hear how speakers from academia and industry utilize ZEISS Crossbeam technology and learn about their application examples

Discuss your specific use case with the community during three Q&A sessions

Watch a live demonstration of the workflow performed on ZEISS Crossbeam laser with ToF-SIMS from anywhere

Dr. Josef Faigle
General Manager CEO, Quality Analysis GmbH

Tim Schubert
Research Associate, Materials Research Institute, Aalen University

Prof. Dr. Rasmus Schröder
Group Leader, Center for Advanced Materials, Heidelberg University

Dr. Daniel Braun
Failure Analysis Specialist (Electric/Electronics), BMW Group

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Speakers Profiles

Dr. Daniel Braun

Daniel Braun is a Failure analysis specialist with focus on electronics at the BMW Group since 2015. Prior to joining BMW, he worked as a Technology Scout for Coatings for iwis Motorsysteme. During his academic career, Dr. Braun acquired Diploma and Master of Science in Materials Engineering followed by PhD studies at the Karlsruhe Institute of Technology under the supervision of Prof. Peter Gumbsch.

Dr. Antonio Casares

Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.
Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree, summa cum laude, in “Charged Particle Optics”. Antonio was employed with the Max-Planck Institute as “Aerospace Instrument Scientist” and the Oak Ridge National Laboratory Nuclear Physics Division in the USA before he joined Carl Zeiss Strategic Business Development in August 2002.

Josef Faigle

Josef Faigle is the managing principal shareholder (CEO), co-founder and technical head of laboratories of Quality Analysis GmbH - a high-tech-service center for quality assurance, accredited according to DIN EN ISO/IEC 17025:2018 as an independent third party. He was born in 1967 and is trained both as a technician and as a business economist, with decades of experience in the industry of high-precision components and systems, managing director of various companies and board member of an international technology group and back to the roots as an independent inventor and doer.

Dr. Peter Gnauck

Peter Gnauck recieved his PhD from the Eberhard Karls University, Faculty of Phyiscs in 2000. From 1995 - 1999 he worked as a research scientist at the NMI (Natural and Medical Science Institute) in Reutlingen, Germany. From 1999 - 2001 he was Project Manager in the R+D department at Carl Zeiss NTS, Oberkochen Germany. During 2001 and 2006 he worked as Product Manager for Focused Ion Beam systems at Carl Zeiss NTS. Since 2006, he holds the position of Business Development Manager at Carl Zeiss Microscopy.

Prof. Dr. Rasmus Schröder

After studying physics, theoretical physics, and biology at University of Heidelberg and Trinity College, Dublin, Rasmus Schröder became interested in application of and methodological developments for electron microscopy. He worked at the Max-Planck Institutes of Medical Research in Heidelberg and Biophysics in Frankfurt, before joining his alma mater in 2008, now as Professor of Cryo Electron Microscopy. At present, he also is Principle Investigator of the Cluster of Excellence “3D Matter Made 2 Order”, director of the “Advanced Imaging Platform” of the HEiKA Heidelberg Karlsruhe Strategic Partnership, and one of the directors of the “BioQuant” of the University of Heidelberg.

Tim Schubert

Tim Schubert is a research associate at the Materials Research Institute Aalen (IMFAA) working in the field of Additive Manufacturing as well as materials microscopy and image analysis as the responsible person for microscopic equipment. He is a trained materials tester and studied Materialography (Bachelor) and Advanced Materials and Manufacturing (Master) at Aalen University both on the topic of Additive Manufacturing of tungsten carbide hard metals. He is currently working on his Ph.D. on the same topic. In the field of materials microscopy the work focuses on application of correlative microscopy, FIB/SEM and laser assisted preparation for microstructure characterization.

Dr. Heiko Stegmann

Physics studies and doctorate at the University of Heidelberg, Germany 1990-1998, specializing in analytical TEM for biophysics applications. Post-doc in 3D TEM of motor proteins at the Max Planck Institute for Medical Research, Heidelberg, Germany, 1998-2000. Senior Materials Analyst at AMD Saxony LLC & Co. KG, Dresden, Germany, 2001-2004, working on physical failure analysis and process development support, as well as characterization method development using TEM and FIB. Since 2004, expert and advisor on FIB-SEM application at Carl Zeiss Microscopy GmbH, Oberkochen, Germany, with emphasis on characterization of nanostructures for failure analysis and manufacturing process development, using techniques such as FIB, SEM, STEM, EDX, FIB-SIMS, and working on their continuous improvement.