Virtual FE-SEM Summit

July 6-8, 2021

Challenging Gemini Applications

Join our virtual summit with FE-SEM experts

After more than 20 years of technological leadership in the FE-SEM space, the Gemini concept has evolved to maintain significant advantages in terms of performance across a wide range of application challenges.

In this virtual summit, we will explore a plethora of sample types in materials science and discuss how advances in detection technology, correlative microscopy and in situ measurements have continued to drive performance and development of this profoundly unique column design.

Combining machine learning, lasers, in situ heating & tension, Raman spectroscopy and many other techniques, we take a look at how this suite of techniques is being used to address modern societal challenges.

Key topics:

  • FE-SEM Detections Possibilities in Material Sciences
  • FE-SEM Within Multimodal Microscopy
  • FE-SEM in situ Experiments

Join us and the Institute of Material Research at Aalen University in Germany for live talks and Q&As with knowledgeable FE-SEM users.
We welcome you to attend just one or more sessions.

Choose one or more live sessions and register in the form.

In cooperation with:

FE-SEM Detection Day

Applications in Material Sciences

The Gemini concept remains the gold standard for contrast and resolution across the widest application range. We kickoff with an in depth look at how the Gemini column itself has evolved to provide superior imaging for modern magnetic materials, polymers used in the electrification of transportation and advanced steels for infrastructure development.

Tuesday, 6th July 2021

10.00 a.m. - 12.00 p.m. (CEST)

10.00

Welcome

Christian Jaeger (ZEISS Microscopy)

10.10

Host of the day: Aalen University

Gerhard Schneider (Aalen University, Germany)

10.20

Up to the Limits of FE-SEM Applications on Energy Related Materials

Ute Golla-Schindler (Aalen University, Germany)

10.40

Silicon-based Composite Anodes for Li-ion Batteries: Morphology Changes and Ageing

Roland Brunner (Materials Center Leoben, Austria)

11.00

Q&As: FE-SEM-In-Lens Detection

Timo Bernthaler (Aalen University, Germany)

11.10

The Impact of Advanced SEM on Materials Characterisation: Imaging and Microanalysis at the “Sweet Spot”

Sato Kaoru (JFE Techno-Research Corporation, Japan)

11.40

Development of Substrates for Surface Enhanced Raman Spectroscopy (SERS)

Claus Burkhard (Natural and Medical Sciences Institute, Germany)

11.50

Q&As: Multiple Detection

Timo Bernthaler (Aalen University, Germany)

12.00

End of Day 1

 

Watch the Webinar Recording

Correlative Microscopy Day

FE-SEM Within Multimodal Microscopy

Correlative microscopy is on the cutting edge of application development in microscopy. On day 2, we look at how it expands the capabilities of the SEM to study molecular spectroscopy and advanced multiscale workflows covering orders of magnitude in size to address issues related to clean air and healthy oceans as well as paving the way for new investigations of deeply buried structures.

Wednesday, 7th July 2021

10.00 a.m.- 12.15 p.m. (CEST)

10.00

Welcome

Antonio Casares (ZEISS Microscopy)

10.10

Raman Imaging and Scanning Electron Microscopy

Armin Zankel (Austrian Center for Electron Microscopy and Nanoanalysis, Austria)

10.40

Applying Femtosecond Laser Preparation for FIB-SEM Analysis

Tim Schubert (Aalen University, Germany)

11.10

Correlative Microscopy of Catalysts Device to Atomic Level

Dogan Ozkaya (Johnson Matthey Technology Centre, UK)

11.40

Software solutions for Correlative Microscopy Workflows

Markus Böse (ZEISS Microscopy)

12.00

Q&As: Correlative Microscopy

Tim Schubert (Aalen University, Germany)

12.15

End of Day 2

 

Watch the Webinar Recording

Automated in situ Day

FE-SEM in situ Experiments

As demands on materials increase towards operation at their limits, testing of these systems under force and temperature at their performance envelope is critical. On day 3, we round off the workshop by looking at a number of in situ techniques covering nanoindentation, micro digital image correlation, diffraction and 3D tomography based on STEM imaging.

Thursday, 8 th July 2021

10.00 a.m. -12.30 p.m. (CEST)

10.00

Welcome

Fang Zhou (ZEISS Microscopy)

10.10

Recent Innovation in SEM in-situ Extreme Mechanics at Micro- and Nanoscale

Nicholas Randall (Alemnis, Switzerland)

10.40

Development and Application of a Multifunctional Nanoindenter Integrated in-situ SEM

Fabien Volpi (Université Grenoble-Alpes, France)

11.10

Operando SEM for Accelerated Materials Technology Development

Stephan Hofmann (Cambridge University, UK)

11.40

Scanning-transmission and Tomographic Imaging in SEM

Matteo Ferroni (University of Brescia, Italy)

12.10

Q&As: Automated in situ Tensile Testing

Luyang Han (ZEISS Microscopy)

12.20

Closing Words

Fang Zhou (ZEISS Microscopy)

12.30

End of the ZEISS Virtual FE-SEM Summit 2021

 

Watch the Webinar Recording

Speakers Profiles

Matteo Ferroni, Ph.D.

Matteo Ferroni received the PhD degree in Physics at the University of Ferrara in 1998, and became Associate Professor in Experimental Physics in 2017. Presently, he is serving at the at the Department of Civil, Environmental, Architectural Engineering and Mathematics of the University of Brescia and collaborates with the Bologna Unit of the Institute for Microelectronics and Microsystems of the CNR. The main research topic is electron microscopy (SEM, FIB, TEM) for materials characterization.

Dr. Claus J. Burkhard

Claus J. Burkhardt studied physics at the University of Tübingen and got his PhD in surface sciences and instrumentation (XPS and LVFIB-SIMS) at the institute of applied physics.
In 1998 he joined the NMI in the department of Wilfried Nisch as project leader developing novel analytical methods and tools (ion milling in a TEM, in-situ lift-out of TEM lamellas, cryo FIB-SEM, cryo-SIMS, Raman spectroscopy with SERS and TERS, preparation and analysis of biological-technical interfaces).
Since 2018 he is a group leader at the NMI center for nanoanalysis.

Dr. Armin Zankel

Armin Zankel: Studies of technical physics at the Graz University of Technology. Graduation with a work in the field of experimental physics. He received his doctorate in technical physics from the Graz University of Technology with a dissertation in the field of electron microscopy. He is senior scientist at the Austrian Center for Electron Microscopy and Nanoanalysis (www.felmi-zfe.at), Graz, Austria, which consists of the Institute of Electron Microscopy and Nanoanalysis of the Graz University of Technology and the Graz Centre for Electron Microscopy. He published many papers in the fields of in situ investigations in the ESEM, 3D investigations with serial block face scanning electron microscopy (SBFSEM) and correlative electron microscopy, applying the system RISE (Raman Imaging and Scanning Electron Microscopy), which combines scanning electron microscopy (SEM), Raman spectroscopy and energy dispersive X-ray spectroscopy, on polymers.
 

Dr. Antonio Casares

Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.
Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree, summa cum laude, in “Charged Particle Optics”. Antonio was employed with the Max-Planck Institute as “Aerospace Instrument Scientist” and the Oak Ridge National Laboratory Nuclear Physics Division in the USA before he joined Carl Zeiss Strategic Business Development in August 2002.

Tim Schubert

Tim Schubert is a research associate at the Materials Research Institute Aalen (IMFAA) working in the field of Additive Manufacturing as well as materials microscopy and image analysis as the responsible person for microscopic equipment. He is a trained materials tester and studied Materialography (Bachelor) and Advanced Materials and Manufacturing (Master) at Aalen University both on the topic of Additive Manufacturing of tungsten carbide hard metals. He is currently working on his Ph.D. on the same topic. In the field of materials microscopy the work focuses on application of correlative microscopy, FIB/SEM and laser assisted preparation for microstructure characterization.

Dr. Ute Golla-Schindler

Ute Golla-Schindler is senior scientist in the material research institute (IMFAA) at the University of Aalen. Working on energy related materials. She studied at the University of Münster, Germany, Diploma in physics: Measurement of Transmission and Backscattering in Low-Voltage Scanning Electron Microscopy and Ph.D. in Physics: Investigation of Resolution and Detection limits in element distribution images in the TEM. For one year application specialist scanning electron microscopy for Carl Zeiss NTS GmbH in Oberkochen. Lecturer and research scientist in the Institute of Mineralogy at the University Münster. Leader of the electron microscopy laboratory working on exsolution phenomena and magnetic properties in minerals, toxicology of nanoparticles and involved in the SESAM/SATEM project with Carl Zeiss GmbH. Starting 2010 in the electron microscopy group of material science at the University of Ulm. Working in the SALVE (Sub Ångström Low-Voltage Transmission Electron Microscopy) project on radiation damage effects in electron microscopy and group leader for battery materials. Since April 2016 senior scientist in Aalen.

Dr. Timo Bernthaler

Timo Bernthaler, earned his PhD from School of Materials Science and Engineering at University of New South Wales. He is board member of the Materials Research Institute at Aalen University and CEO of the company Matworks GmbH in Germany. Research focus is on structural and functional materials and method development in materialography and quantitative microstructural analysis using machine learning and artificial intelligence. Topics are additive manufacturing and materials for energy conversion and storage to obtain processing, microstructure, property and quality relationships. Since many years he members committees on microscopy, quantitative image analysis, and data science.

Prof. Dr. rer. nat. Gerhard Schneider

Gerhard Schneider studied metallurgy at Stuttgart University, Germany, and graduated in 1988 at the Max-Planck-Institute for Metals Research in Stuttgart where he did research on Fe-Nd-B-based hard magnetic materials. After a postdoctoral appointment at the University of Sao Paulo, Brazil he joined Robert Bosch GmbH. His last position there was head of Bosch research in USA, Palo Alto, CA. Today he is President of Aalen University, Germany and Director of the Materials Research Institute Aalen.

Dr. Nicholas X. Randall

Nicholas X. Randall is a Chartered Engineer (CEng MIM) and holds a B.Sc. in Materials Science from Brunel University (London, UK) 1994 and a Ph.D. from Neuchatel University (Neuchatel, Switzerland) 1997. After co-founding CSM Instruments, a spin-off of CSEM, in 1997 he served as Customer Services Manager and then Vice President of Business Development during the setup of the US subsidiary of CSM Instruments in Boston, MA. He was then Lead Scientist & Business Development with Anton Paar, following their acquisition of CSM Instruments in 2013. He is now Vice President of Alemnis AG. He has over 70 scientific publications and teaches regularly in small-scale mechanical testing.

Dr. Roland Brunner

Dr. Roland Brunner, PD (male) is a group leader at the MCL, Department of Microelectronics. He focuses on imaging methods and analysis in particular on 3D nano-and microstructure visualization to provide improved design guidelines for industrial relevant applications especially in the field of green electronics and energy storage. He did is PhD in semiconductor/material physics at the Montanuniversitaet Leoben (MUL). He worked e.g. as a University Assistant at the MUL and research physicist in Japan, within an ICORP-project funded by JST. In 2012 he joined the MCL as a key researcher. In 2014 he obtained his facultas docendis and was appointed to priv. Doz. for material science at the MUL and is coopted by the University of Graz in the Doctor School of Natural Science. He is lector at the Montanuniversität Leoben at the Institute of Physics.

Dr. Doğan Özkaya

Doğan Özkaya is a Scientific consultant and in charge of electron microscopy team in Johnson Matthey Technology Centre, Sonning Common, U.K. He holds a Ph.D. in Materials Science and Metallurgy from the University of Cambridge. He carried out postdoctoral research in electron microscopy of various materials in several university departments, including the Cavendish Laboratory and Department of Materials and Metallurgy of University of Cambridge as well as the Materials Department, University of Oxford, before joining Johnson Matthey in 2003.

Prof. Stephan Hofmann

Stephan Hofmann is Professor of Nanotechnology at the Department of Engineering at Cambridge University, and Director of the NanoDTC Doctoral Training Centre in Nanotechnology (www.nanodtc.cam.ac.uk). His research group (hofmann-group.eng.cam.ac.uk) works on the application driven exploration of new device materials, bridging from fundamental discovery and characterisation of properties to functional device integration and manufacturing pathways. He graduated in Physics at the Technische Universität München and obtained his Ph.D. at the University of Cambridge. Prior to his faculty position, he held a Dorothy Hodgkin Fellowship by the Royal Society and a Research Fellowship at Peterhouse, Cambridge, where he is currently a Fellow.

Dr. Sato Kaoru

Dr Sato Kaoru is an expert on electron microscopy with a forte in material and surface design based on microstructure analysis. Dr Sato Kaoru received his PhD from the Department of Metallurgy and Materials Science at the University of Cambridge, UK. Today, he is a Fellow of JFE – Techno-Research Corporation. Before that he was a General Manager and Principal Researcher at JFE Steel Corporation. He is, or has been a lecturer at various institutions including the Electron Microscope University of the Japanese Society of Microscopy and the Art, Science and Technology Center for Cooperative Research at Kyushu University. He is the recipient of numerous awards in the field of steel and materials development and has authored various papers throughout his career.

Dr. Luyang Han

Luyang Han has been working as an application engineer at Carl Zeiss Microscopy GmbH since 2014. In his position, he focuses on the application of the scanning electron microscope in materials science and the development of new technologies in SEM. Before that, he worked at the Leibniz Institute for Solid State and Materials Research as a scientist specializing in nanomaterials. He studied materials science and solid state physics at Ulm University and received his doctorate.

Dr. Markus Böse

Markus Boese is an application specialist for the materials science marketing team at ZEISS Microscopy (Oberkochen). He holds a Ph.D. in Chemistry from the University of Bonn. For his postdoctoral research in electron microscopy he joined several research facilities: Ernst Ruska Center (Juelich), Trinity College (Dublin) and the National Center of Electron Microscopy (Berkeley). At ZEISS microscopy he started 2012 working in product management, supporting the development of the latest electron microscope products. His current activities at ZEISS are focusing on soft materials ranging from biomaterials, polymers to microplastics.

Fabien Volpi, Ph.D.

Fabien Volpi is associate-professor at the SIMaP lab (Université Grenoble-Alpes, France). His main fields of research are the electrical and mechanical characterisations of functional materials (dielectrics, metallic alloys, integrated/architectured materials,...) and the experimental development of characterisation devices combining electrical and mechanical sensing. In particular, he developed a device based on a nanoindenter functionalized for electrical measurements and integrated in-situ in an SEM.

Dr. Fang Zhou

Fang Zhou is serving as a Manager Business Sector in the business sector Materials Science at ZEISS Research Microscopy Solutions. His main focuses currently are in-situ microscopy, as well as multimodal and multiscale correlative microscopy. He joined Zeiss Microscopy as a Product Manager for FESEM in 2012. Prior to this he worked for Applied Materials, Inc. and the University of Tübingen. He holds a PhD in Applied Physics from the University of Tübingen, a M.S. degree from Chinese Academy of Sciences in Beijing and a B.S. degree from Zhejiang University in Hangzhou, China.