Lattice SIM opened the door to new applications by enabling gentle super-resolution imaging down to 120 nm at incredible high speed and with the ability to image deeper into challenging samples.
Experience a revolution of structured illumination microscopy: SIM². Hear from our experts about challenges they face due to the current limitations of existing technology, and how they can be solved through new innovations.
Learn how to:
- Discriminate sub-organelle structures down to 60 nm without the need for special sample preparation or expert knowledge of complex techniques
- Capture highly dynamic processes at exceptional resolution in all three dimensions
- Get outstanding out-of-focus light suppression for the sharpest sectioning in wide-field microscopy
- Make super-resolution acquisition faster than ever before
Watch the recording of the "Join us at 60 nm" launch event from April 28 here. We are excited to show you ZEISS SIM² - a novel image reconstruction algorithm that doubles the conventional resolution of your structured illumination microscopy (SIM) data.
For more information on SIM², visit the product website of our super-resolution platform ZEISS Elyra 7.