Virtual System Demonstration

ZEISS AI Sample Finder

April 27, 2021 | 2 - 3 PM (CEST)

Use Artificial Intelligence to drive Efficiency in your Microscopy Setup

Reduce your time to experiment from minutes to seconds

In this live demonstration you will see for yourself the new way to operate your microscope. Be amazed at how easy it is to acquire images from a wide range of samples in a variety of conditions. Reduce the time it takes to start your imaging from minutes to just seconds and start your experiments right away.

Using classical microscopes, functions such as finding your sample carrier, adjusting the focus and identifying the regions you wish to image still require manual adjustments. The AI Sample Finder automates this sequence entirely, even with low-contrast or translucent samples. AI Sample Finder enables you to view your entire sample with unmatched speed and ease. The sample carrier and sample areas are automatically identified using deep learning algorithms.

This unique technology may also be suitable for enhancing the experience of using your current ZEISS Axio Observer 7, LSM 900 and LSM 980 systems.


Key Learnings

  • Rapidly generate a navigable overview image with assigned sample regions with minimal user interaction
  • Use deep-learning algorithms for automatic calibration of carriers, such as well plates
  • Capture fast, detailed overviews using a novel contrasting technique
  • Benefit from using AI Sample Finder by integrations into all your imaging workflows

Program

  • ZEISS AI Sample Finder - Gert Sonntag (10 min)
  • System Demonstration - Dr. Frank Vogler (35 min)
  • Q&A (15 min)

Speakers

Dr. Frank Vogler

In his PhD and postdoctoral studies at the University of Regensburg, Frank studied cell polarity establishment and polarized tip growth using molecular biology, biochemistry, and quantitative live cell imaging techniques. He joined ZEISS in 2018 as an application specialist for automated and confocal imaging.

Dr. Frank Vogler ZEISS Research Microscopy
Dr. Gert Sonntag

Gert has been a sales and application specialist at ZEISS since 2001. As an expert in 3D imaging, Gert supports key account customers in Germany and Southeastern Europe. In recent years, he established numerous workshops in our demo centers and also in the customer environment.

Gert Sonntag ZEISS Research Microscopy
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