X-ray Microscopy
Applications in Materials Science: Non-destructive 3D Imaging
Non-destructive 3D Imaging of a Ceramic Matrix Composite (CMC)
Watch the video and learn more
- Perform multiscale imaging at three levels of magnification
- Scout the large sample to identify a region of interest (ROI)
- Zoom into ROI to image targeted volumes at high resolution
- Non-destructive workflow, without modifying or re-mounting the sample
This is possible thanks to the Resolution at a Distance (RaaD) architecture of ZEISS Xradia Versa systems.
Sample courtesy of Dr. David Marshall, University of Colorado
The Technology behind Scout-and-Zoom
Multiscale tomography workflows

Scout-and-Zoom is a unique capability of ZEISS X-ray microscopes that leverages low magnification to perform exploratory 'Scout' scans across a large field of view to identify interior regions of interest for higher resolution 'Zoom' scans without complex sample preparation. The workflow is enabled by
- Resolution at a Distance (RaaD)
- User-selected objectives
- Automated sample positioning stage.
Questions? Contact us!
Send us your message or request a demonstration
Do you have questions how ZEISS Xradia X-ray microscopes support you to achieve your research goals in Materials Science? You would like to receive more information, a quote, or a product demonstration? Contact us!