X-ray Microscopy
Applications in Materials Science: Non-destructive 3D Imaging
Non-destructive 3D Imaging of a Ceramic Matrix Composite (CMC)
Watch the video and learn more
- Perform multiscale imaging at three levels of magnification
- Scout the large sample to identify a region of interest (ROI)
- Zoom into ROI to image targeted volumes at high resolution
- Non-destructive workflow, without modifying or re-mounting the sample
This is possible thanks to the Resolution at a Distance (RaaD) architecture of ZEISS Xradia Versa systems.
Sample courtesy of Dr. David Marshall, University of Colorado
The Technology behind Scout-and-Zoom
Multiscale tomography workflows
![Three-stage Scout-and-Zoom workflow]({"small":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/xrm-app-video-01/scout-and-zoom-workflow.ts-1549530877294.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=3ec3a2d6d790efde7f4b83f11d9dd739","large":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/xrm-app-video-01/scout-and-zoom-workflow.ts-1549530877294.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=adafc4df78be72c16338d256b7de2e1e","medium":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/xrm-app-video-01/scout-and-zoom-workflow.ts-1549530877294.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=15e11ecf05d6c8543697c6465c2d6555","full":"https://images.zeiss.com/Microscopy/LandingPages/Campaign%20Landing%20Pages/global-campaigns/fy1819/materialsscience/xrm-app-video-01/scout-and-zoom-workflow.ts-1549530877294.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=76884c95d223d300151508f0da6577bf"} "Three-stage Scout-and-Zoom workflow")
Scout-and-Zoom is a unique capability of ZEISS X-ray microscopes that leverages low magnification to perform exploratory 'Scout' scans across a large field of view to identify interior regions of interest for higher resolution 'Zoom' scans without complex sample preparation. The workflow is enabled by
- Resolution at a Distance (RaaD)
- User-selected objectives
- Automated sample positioning stage.
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Do you have questions how ZEISS Xradia X-ray microscopes support you to achieve your research goals in Materials Science? You would like to receive more information, a quote, or a product demonstration? Contact us!