- Add 3D topographical information at the atomic level to your SEM
- Position the AFM tip on any surface under SEM control
- Conduct in situ high-resolution measurements of mechanical, electrical, chemical, thermal and magnetic properties
The integrated AFM is a high resolution, sample scanning system that scans a volume of 25 μm × 25 μm × 5 μm and a maximum sample size of 10 mm. The design allows a minimum working distance of 5 mm, which delivers excellent SEM performance and is compatible with FIB-SEM operation.
ZEISS FE-SEMs and FIB-SEMs are based on Gemini electron optics. The design lets you maximize the electron optical performance while enabling excellent imaging on any sample, allowing high resolution imaging and high signal-to-noise ratios for best image quality.
Need all the information about the only true in situ AFM Solution from ZEISS? Download the Product Brochure below and go into the details. Learn about advantages of the ZEISS AFM-SEM solution, applications and the technical specifications.
See what’s possible in nanomaterials research. Download the white papers and learn how to use the power of AFM-SEM to analyze helium ion beam exposed nanostructures. Enable scanning thermal microscopy of surfaces with lateral resolutions better than 50 nm.
Get in touch with us to find out more about the benefits of ZEISS Microscopy Solutions for your research, book a demo at our customer center, or get a quote. We are looking forward to hearing from you.