Download the white paper and learn how to

• Explore nanoparticles and, in general, nanofeatures of sizes smaller than 100 nm
• Use Secondary Ion Mass Spectrometer (SIMS) to provide elemental imaging with spatial resolution smaller than 15 nm
• Visualize samples using a helium beam focused to probe sizes less than 1 nm
• Combine high resolution He+ imaging with Ne+ SIMS elemental mapping on the same platform