Do you want to perform non-destructive mapping of grain morphology in 3D to characterize materials like metals, alloys or ceramics? Discover the first commercially available lab-based diffraction contrast tomography (DCT) technique for complete three-dimensional imaging of grains in your sample. Two powerful solutions—LabDCT Pro and CrystalCT—allow you to directly visualize 3D crystallographic grain orientation. Powered by the advanced GrainMapper3D software, it opens new ways to investigate a variety of polycrystalline materials.
ZEISS Xradia Versa LabDCT Pro and Xradia CrystalCT advance materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes.
- Provides unprecedented sample representivity
- Enables scanning larger sample volumes
- Simplifies sample prep, and handling of irregular / realistic sample shapes
- Increases speed
- Addresses sample specificity
Inspired by nature’s golden angle, advanced scanning modes deliver helical phyllotaxis schema to manage a wide range of sample shapes and sizes, and overcomes some of the previous challenges of conventional DCT:
- Helical phyllotaxis when your sample is tall and narrow
- Helical phyllotaxis raster when your sample is large and wide
- Helical phyllotaxis with high aspect ratio tomography (HART) for flat samples.
DCT projection images produce distinct diffraction patterns on the detector based on their focusing geometries. In Laue focusing mode, grains produce diffraction spots that are sharp lines on the scintillator-coupled objective-based detector. Projection geometry uses the flat panel detector positioned in the magnifying or defocused position to collect diffraction spots that appear as projected shape profiles of the corresponding diffracting grains. The LabDCT Pro module on the ZEISS Xradia 620 Versa enables grain mapping on both the dedicated 4X DCT objective and on the optional flat panel detector providing the flexibility to choose between high resolution or high throughput large area grain mapping, whereas ZEISS Xradia CrystalCT uses its own dedicated flat panel detector in projection mode.
ZEISS Xradia CrystalCT is the world’s first commercially available laboratory DCT built on a microCT platform, which is additionally a highly-functional imaging system providing superb resolution and image quality for a range of 3D imaging needs. Learn more
Get in touch with us to find out more about the benefits of CrystalCT and LabDCT, X-ray microscopy and other ZEISS solutions for your research, book a demo at our customer center, or get a quote. We are looking forward to hearing from you.