ZEISS Workshop | Basic Course Scanning Electron Microscopy (SEM)

Microscopy Course

Electron Microscopy

Basic Course

Scanning Electron Microscopy (SEM)

  • Description
    General

    Are you new to scanning electron microscopy? Interested in how to get the maximium out of your instrument?
    This course provides the basic knowledge on the functions, technology and operation of a scanning electron microscope (SEM). Learn how successfully operate a SEM and to handle basic sample preparation techniques.

    Topics

    • Components and functions of a SEM
    • Preparation of conductive and nonconductive samples. Difference between material and biological samples
    • Detectors - Selection and operation
    • Image acquisition settings and adjustment of the electron beam
    • Causes of image artefacts
    Date August 22 - 24, 2017
    Duration 3 days, 9 am - 4 pm
    Participants max. 4
    Language English
    Course Fee
    Course Fee: 2,163.00 EUR for a three day course excl. tax
    Course material and lunch are included
    (All prices are valid for business customers. If you are a private consumer we would be pleased to provide you with an individual quotation.)
    Location ZEISS Microscopy Customer Center Oberkochen
    Rudolf-Eber-Straße 2
    73447 Oberkochen
  • Registration

    Basic Course Scanning Electron Microscopy (SEM)

    Date2017-08-22 - 2017-08-24
    StatusRegistration: Expired
    Registration deadline2017-07-23
    LocationZEISS Microscopy Customer Center Oberkochen, Rudolf-Eber-Stra├če 2, 73447 Oberkochen

    For further information or questions, please contact: courses .microscopy .de @zeiss .com

    Course Target
    Are you new to scanning electron microscopy? Interested in how to get the maximium out of your instrument?
    This course provides the basic knowledge on the functions, technology and operation of a scanning electron microscope (SEM). Learn how successfully operate a SEM and to handle basic sample preparation techniques.

    - Components and functions of a SEM
    - Preparation of conductive and nonconductive samples. Difference between material and biological samples
    - Detectors - Selection and operation
    - Image acquisition settings and adjustment of the electron beam
    - Causes of image artefacts

    Course Fee: 2,163.00 EUR for a three day course excl. tax
    Course material and lunch are included
    (All prices are valid for business customers. If you are a private consumer we would be pleased to provide you with an individual quotation.)

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If you have further questions, please contact:  courses .microscopy .de @zeiss .com

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