ZEISS Workshop | Basic Course Scanning Electron Microscopy (SEM)

Microscopy Course

Electron Microscopy

Basic Course Scanning Electron Microscopy (SEM) Oct

Basic Course

Scanning Electron Microscopy (SEM)

Description

General

Are you new to scanning electron microscopy? Interested in how to get the maximium out of your instrument?
This course provides the basic knowledge on the functions, technology and operation of a scanning electron microscope (SEM). Learn how successfully operate a SEM and to handle basic sample preparation techniques.

Topics

  • Components and functions of a SEM
  • Preparation of conductive and nonconductive samples. Difference between material and biological samples
  • Detectors - Selection and operation
  • Image acquisition settings and adjustment of the electron beam
  • Causes of image artefacts
Date October 24 - 26, 2017
Duration 3 days, 9 am - 4 pm
Participants max. 4
Language English
Course Fee
Course Fee: 2,163.00 EUR for a three day course excl. tax
Course material and lunch are included
(All prices are valid for business customers. If you are a private consumer we would be pleased to provide you with an individual quotation.)
Location ZEISS Microscopy Customer Center Oberkochen
Rudolf-Eber-Straße 2
73447 Oberkochen

Registration

Basic Course Scanning Electron Microscopy (SEM)

Date2017-10-24 - 2017-10-26
StatusRegistration: Expired
Registration deadline2017-10-11
LocationZEISS Microscopy Customer Center Europe, Rudolf-Eber-Stra├če 2, 73447 Oberkochen

For further information or questions, please contact: courses .microscopy .de @zeiss .com

Course Target
Are you new to scanning electron microscopy? Interested in how to get the maximium out of your instrument?
This course provides the basic knowledge on the functions, technology and operation of a scanning electron microscope (SEM). Learn how successfully operate a SEM and to handle basic sample preparation techniques.

- Components and functions of a SEM
- Preparation of conductive and nonconductive samples. Difference between material and biological samples
- Detectors - Selection and operation
- Image acquisition settings and adjustment of the electron beam
- Causes of image artefacts

Course Fee: 2,163.00 EUR for a three day course excl. tax
Course material and lunch are included
(All prices are valid for business customers. If you are a private consumer we would be pleased to provide you with an individual quotation.)

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