Basic FE-SEM training course (Field-Emission Scanning Electron Microscope)
This practical training course provides specific information about the basic work with Scanning electron microscopes (SEM). In detail, the user will be able to prepare various samples for SEM examination. The focus is on the positioning, acquisition and analysis of samples, in order to fulfill certain objectives. Furthermore, the user will be able to interpret and evaluate the images and to derive necessary optimization steps.
Topics of the course
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Date |
September 14 - 16, 2021 |
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Duration |
3 day(s) |
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Language |
English |
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Participants |
Max. 4 |
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Prerequisites |
Self-study of handouts and literature links |
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Location |
Oberkochen, Germany |
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