Application of Ultra-short Pulsed Lasers for Improved Microscopy Sample Preparation

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Cheryl Hartfield Product Marketing Manager for Materials Research & Electronics
ZEISS Microscopy

The emergence of ultra-short pulsed lasers for sample preparation opens new workflow strategies as well as challenges in knowing which approach to use. This  talk will give an overview of different sample preparation strategies for high-resolution imaging and analysis, with application examples showcasing new  capabilities enabled by a FIB-SEM with integrated fs-laser.

Key Learnings:

  • Introduction to cross-section techniques
  • Review of mechanical methods, BIB, FIB-SEM, ex situ USP lasers, integrated laser FIB-SEM
  • LaserFIB applications and technique comparisons

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