Imaging Magnetic Samples Using ZEISS FE-SEM

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Luyan Han
Dr. Luyang Han Application Development Engineer, ZEISS Microscopy

Can a scanning electron microscope image magnetic material?” This is a common question asked by many people. There are legitimate concerns when trying to put magnetic samples in an SEM: will the magnetic field from the sample disturb the imaging? Will the sample be attracted into the lens and damage the SEM? In this webinar, these questions will be discussed in detail. Several example will be given to highligh the correct method to image magnetic materials. At the end a special contrast mechanism to image magnetic domains in SEM will also be explored.


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