The LaserFIB - Introduction to a new Class of Instruments
Learn all about the technical details and capabilities of the LaserFIB
![]({"small":"https://images.zeiss.com/Microscopy/resource-center/authors/tobias-volkenandt.ts-1586360638075.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=32%2C0%2C422%2C422&w=640&s=cc91982a892301e72c23ad9a7f58d35a","large":"https://images.zeiss.com/Microscopy/resource-center/authors/tobias-volkenandt.ts-1586360638075.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=32%2C0%2C422%2C422&w=1280&s=3c62d25d89aba16cce03776746b2c60e","medium":"https://images.zeiss.com/Microscopy/resource-center/authors/tobias-volkenandt.ts-1586360638075.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=32%2C0%2C422%2C422&w=832&s=b3745b906e5ff00404aeb066e2bd6454","full":"https://images.zeiss.com/Microscopy/resource-center/authors/tobias-volkenandt.ts-1586360638075.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=32%2C0%2C422%2C422&w=1920&s=c4c06a5e203e8e597bb93f2136d33d98"})
Tobias Volkenandt
Apps Development Specialist, ZEISS Microscopy
FIB-SEMs are well established as sample preparation tools. However, when it comes to large-scale sample preparation FIB milling is simply too slow. With the LaserFIB we introduce a new class of instruments to overcome this limitation. A LaserFIB enables sample preparation with material removal rates up to 15 Mio µm³/s.
In this webinar you will learn all about the technology and capabilities of the LaserFIB and understand the site-specific preparation workflow in detail.
![]({"small":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/the-laser-fib.ts-1586852993246.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=4ab5fbede595a9459240cef31b4962cf","large":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/the-laser-fib.ts-1586852993246.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=d5d39723b2fdca08ae81025c6dec9ca9","medium":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/the-laser-fib.ts-1586852993246.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=50a57670283f6ad5f3ec9ed431df2234","full":"https://images.zeiss.com/Microscopy/resource-center/screensaver/psdfiles/the-laser-fib.ts-1586852993246.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=efdd0e367695cf506e31997f6577bba7"})
Please register for full access to Microscopy Insights Hub
- Learn about microscopy topics for your field of application
- Regularly updated with new articles & videos
- One registration for all existing & future content
Unable to load form.
Related Articles
Related Product
![]({"small":"https://images.zeiss.com/Microscopy/resource-center/products-related/product_crossbeam_laserfib.ts-1586360695687.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C42%2C550%2C550&w=640&s=5cd9edb9023fbea0462ee1062510a38d","large":"https://images.zeiss.com/Microscopy/resource-center/products-related/product_crossbeam_laserfib.ts-1586360695687.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C42%2C550%2C550&w=1280&s=a104a8e22fa7a4cfd99c9b1c14646b4b","medium":"https://images.zeiss.com/Microscopy/resource-center/products-related/product_crossbeam_laserfib.ts-1586360695687.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C42%2C550%2C550&w=832&s=0c3f7c399173b1f43ac87e2d6ee3596d","full":"https://images.zeiss.com/Microscopy/resource-center/products-related/product_crossbeam_laserfib.ts-1586360695687.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C42%2C550%2C550&w=1920&s=00c849f5a3a6a6b634bcd72c03c61f23"})