To enable the detection of nanoparticles and nanomaterials such as Graphene with light microscopy, researchers used the superior polarized light contrast from the ZEISS Axio Imager and combined that with the ZEISS total interference contrast (TIC) module which allows the height detection of nano materials. In a next step correlative microscopy supported the relocation of the graphene flake in the ZEISS FE-SEM to be able to observe its structure and chemical composition. As light elements such as carbon and functional groups attached to it cannot be quantified by EDX, researcher made use of the ZEISS in-situ Raman Microscopy (RISE) and thus gained an understanding of the graphene flake quality.