Shuttle & Find
ZEISS ZEN Shuttle & Find for Materials Analysis

ZEISS ZEN Shuttle & Find for Correlative Microscopy in Materials Analysis

Bridging the Micro and Nano World

Uniting Electron and Light Microscopy for Materials Analysis

Available on all ZEISS light- and electron microscopes with motorized stages

Shuttle & Find from ZEISS is a correlative microscopy interface for light- and electron microscopes, designed specifically for use in materials analysis.
A combined hardware and software solution, it allows you to transfer your specimen from one microscope system to another in just minutes – a process that has until now taken hours, or even days.

Shuttle & Find is an extremely flexible two-way system that allows you to combine any number of ZEISS systems for correlative microscopy. It also supports intermediate preparation steps, ensuring your sample is optimally prepared for use when you switch from one system to the other.

Importantly for materials analysis, Shuttle & Find speeds up your workflow by automating the process of searching the same region of interest. This reduces cycle times, allowing you to process a considerable larger number of samples in a shorter period.


Analysis on concrete sample.
Courtesy of Brno University of Technology

  • Fast Relocation of Regions of Interest:
    Acquire an image in your light microscope and mark the regions of interest (ROI). The ROI are saved together with the image of your sample. In your electron microscope you easily reload and relocate the ROI by means of automated calibration and work routines.
  • More Information:
    Combine optical contrasting techniques and information about size, morphology and color gained by your light microscope with the analytical methods of your electron microscope. Discover information about both the structure and function of your sample.
  • One Stop Shopping:
    As the world‘s only manufacturer of both light and electron microscopes in all performance classes, ZEISS is most suited to bridge the micro and nano worlds. ZEISS is your one-stop shop for light microscopes, electron microscopes and the bridge between both.

Correlative Particle Analysis

Greater Insight, Higher Quality

Correlative Particle Analyzer: Fast particle analysis

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ZEISS Shuttle & Find

Bridge the Micro and Nano World in Materials Inspection and Analysis

pages: 12
file size: 9024 kB


White Paper: Analysis and Quantification of Non-metallic Inclusions in Steel

Shuttle & Find

pages: 6
file size: 1951 kB


White Paper: Fast Structural and Compositional Analysis of Aged Li-Ion Batteries with "Shuttle & Find"

Correlative Microscopy allows a high productivity in structural analysis of Li-ion batteries due to a fast, reliable and precise workflow between light microscopy and SEM.This enables new possibilities especially for quantitative image data analysis of the same region of interest.

pages: 6
file size: 1177 kB


White Paper: Fast Structural and Compositional Analysis of Cross-section Samples from an 18th Century Oil Painting with "Shuttle & Find"

"We present the cross–section sample analysis of an oil painting on canvas. Correlative Light and Electron Microscopy (CLEM) is used for analyzing the cross–section samples

pages: 6
file size: 1600 kB


White Paper: Microstructural Investigation of Austempered Ductile Iron (ADI) with "Shuttle & Find"

Interface for Correlative Microscopy in Materials Analysis

pages: 5
file size: 2766 kB


Application Note: Enhancing Material Inspection and Characterization Information and Data Integrity

By Combining Light and Scanning Electron Microscopy in a Correlative Workflow

pages: 8
file size: 1456 kB


Application Note: Graphene Characterization by Correlation of Scanning Electron, Atomic Force and Interference Contrast Microscopy

pages: 5
file size: 1244 kB


White Paper: Topography and Refractive Index Measurement

of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy

pages: 6
file size: 1755 kB


3D Imaging Systems

Your Guide to the Widest Selection of Optical Sectioning, Electron Microscopy and X-ray Microscopy Techniques.

pages: 68
file size: 5952 kB


Microscope and Measurement Systems for Quality Assurance and Quality Control

Capture the essentials of your component. Quickly. Simply. Comprehensively.

pages: 41
file size: 4477 kB

Ask your ZEISS contact about Shuttle & Find now!