Shuttle & Find
Shuttle & Find

Shuttle & Find Correlative Microscopy

Bridging the Micro and Nano World in Materials Analysis

Uniting Electron and Light Microscopy for Materials Analysis

Shuttle & Find from Carl Zeiss is a correlative microscopy interface for light- and electron microscopes, designed specifically for use in materials analysis.
A combined hardware and software solution, it allows you to transfer your specimen from one microscope system to another in just minutes — a process that has until now taken hours, or even days.

Shuttle & Find is an extremely flexible two-way system that allows you to combine any number of Carl Zeiss systems for correlative microscopy. It also supports intermediate preparation steps, ensuring your sample is optimally prepared for use when you switch from one system to the other.

Importantly for materials analysis, Shuttle & Find speeds up your workflow by automating the process of searching the same region of interest. This reduces cycle times, allowing you to process a considerable larger number of samples in a shorter period.


ELYRA – Product Highlights
  • Fast Relocation of Regions of Interest:
    Acquire an image in your light microscope and mark the regions of interest (ROI). The ROI are saved together with the image of your sample. In your electron microscope you easily reload and relocate the ROI by means of automated calibration and work routines.
  • More Information:
    Combine optical contrasting techniques and information about size, morphology and colourgained by your light microscope with the analytical methods of your electron microscope. Discover information about both the structure and function of your sample.
  • One Stop Shopping:
    As the world‘s only manufacturer of both light and electron microscopes in all performance classes, Carl Zeiss is most suited to bridge the micro and nano worlds. Carl Zeiss is your one-stop shop for light microscopes, electron microscopes and the bridge between both.

Correlative Particle Analysis

Greater Insight, Higher Quality

Characterize process-critical particles. Correlative Particle Analyzer combines your data from both light and electron microscopes. After you have detected particles with your light microscope, you can fully automate their relocation and EDX analysis with correlative particle analysis from Carl Zeiss. It is the best way to enhance the characterization of residual particles.

Correlative Particle Analyzer automatically supplies you with a report that integrates your results from both light and electron microscopic analysis. Correlative Particle Analyzer achieves results up to ten times faster than consecutive individual analysis on light and electron microscopes.

Product Trailer



Correlative Microsopy Shuttle & Find

Bridging the Micro and Nano World in Materials Analysis

Pages: 13
Filesize: 3,174 kB

Correlative Particle Analysis

Quickly Characterize and Classify Particles Supporting ISO 16232 by Light and Electron Microscopy

Pages: 17
Filesize: 3,060 kB

Análise Correlativa de Partículas ZEISS (in Portuguese Language)

Caracterize rapidamente e classifique partículas de acordo com ISO 16232 por meio de Microscopia Eletrônica e de Luz

Pages: 17
Filesize: 3,052 kB

Análisis correlativo de partículas de ZEISS (in Spanish Language)

Caracterice y clasifique partículas rápidamente de conformidad con la norma ISO 16232 mediante microscopía óptica y electrónica

Pages: 17
Filesize: 3,115 kB

White Paper: Fast Structural and Compositional Analysis of Aged Li-Ion Batteries with Shuttle and Find

Correlative Microscopy allows a high productivity in structural analysis of Li-ion batteries due to a fast, reliable and precise workflow between light microscopy and SEM. This enables new possibilities especially for quantitative image data analysis of the same region of interest.

Pages: 6
Filesize: 1,177 kB

White Paper: Fast Structural and Compositional Analysis of Cross-section Samples from an 18th Century Oil Painting with "Shuttle & Find"

We present the cross–section sample analysis of an oil painting on canvas. Correlative Light and Electron Microscopy (CLEM) is used for analyzing the cross–section samples, combining the optical properties of light microscopy (LM) with the detailed structural and chemical analysis of the scanning electron microscope (SEM), along with energy dispersive X–ray spectrometer (EDS).

Pages: 6
Filesize: 1,605 kB

White Paper: Microstructural Investigation of Austempered Ductile Iron (ADI) with "Shuttle & Find"

Interface for Correlative Microscopy in Materials Analysis

Pages: 5
Filesize: 2,766 kB

White Paper: Topography and Refractive Index Measurement

of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscop

Pages: 6
Filesize: 1,755 kB

Ask your ZEISS contact about Shuttle & Find now!

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