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Focused Ion Beam Scanning Electron Microscopes
(FIB-SEM)
Speed up nanotomography and nanofabrication applications.
ZEISS FIB-SEMs let you benefit for processing and sample preparation on a nanoscopic scale for materials in life sciences as well as in industry.
- Combine 3D imaging, analysis and material processing
- Profit from a next-generation FIB when preparing your sample
- Enjoy real-time interaction and perform imaging and milling simultaneously