FIB-SEM
Focused Ion Beam Scanning Electron Microscopes
Further information, device demonstration and more

Get in touch with us

FIB-SEM

Your FIB-SEM system for unparalleled ion beam performance

With ZEISS FIB-SEMs or Focused Ion Beam Scanning Electron Microscopes you speed up nanotomography and nanofabrication applications. These scanning electron microscopes combine 3D imaging technology and analysis performance of the Gemini electron beam column with the ability of a focused ion beam for material processing, research and sample preparation on a nanoscopic scale. In addition to outstanding performance, you benefit from maximum stability and a uniform beam profile. Last but not least the graphical control interface of the FIB-SEM is easy to understand and allows interaction in real time.

Crossbeam Family

Your ZEISS FIB-SEM s for nanotomography and nanofabrication. With Crossbeam you combine the imaging and analytical performance of the Gemini column with the ability of a next-generation FIB. Speed up you tomography runs with the 100 nA FIB current.

more

Customized Tools

Find individual products and solutions for your applications.

more
We use cookies on this site. Cookies are small text files that are stored on your computer by websites. Cookies are widely used and help to optimize the pages that you view. By using this site, you agree to their use. more