ParticleSCAN VP

The ruggedised SEM with SmartPI User Interface

ParticleSCAN VP: A New Dimension in Process Control

ParticleSCAN VP is an exciting addition to the ZEISS portfolio of scanning electron microscopes (SEM). ParticleSCAN has been developed for a range of industrial environments either in the field or in a production environment.

The rugged design of ParticleSCAN offers total flexibility and robustness in the automatic analysis of particles.
This fully mobile instrument is suitable for rapid re-location and installation to facilitate analyses where and when needed.

Combined with Variable Pressure (VP) technology to simplify sample preparations, ParticleSCAN drives manufacturing capability and yields workflow improvements.

ParticleSCAN features energy dispersive X-ray spectrometry (EDS), SmartSEM interface software and SmartPI particle analysis software. SmartPI software automatically detects, measures, classifies and records the size, shape and chemical composition of particles and provides you with results in easy to understand reports.

ParticleSCAN VP Applications

24/7 operation with real-time results, self-diagnostics with auto system calibration and automated software to minimalize manual intervention; positions ParticleSCAN as a favourite for industrial applications such as:

  • Manufacturing cleanliness
  • Mining
  • Pharmaceutical powders
  • Environmental particles


ParticleSCAN VP

A New Dimension in Process Control

pages: 5
file size: 704 kB


Your Automated SEM Particle Analysis and Classification Solution

pages: 19
file size: 8779 kB

Microscope and Measurement Systems for Quality Assurance and Quality Control

Capture the essentials of your component. Quickly. Simply. Comprehensively.

pages: 41
file size: 4477 kB

ZEISS SmartPI (Italian Version)

La soluzione SEM automatizzata per l’analisi e la classificazione di particelle

pages: 19
file size: 6367 kB

Results 1 - 4 of 4