Upgrades for Scanning Electron Microscopes
Upgrades
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Upgrades

Benefits for performance and life time

Find out from which upgrades your instrument performance and life time can benefit. Please contact your local sales representative if you have any questions on upgrade opportunities of your product.

Sort of Upgrade Description Available for these instruments
1-Channel-AsB Detector Resolve pure Material Contrast from Your FE-SEM 15xx
SUPRA series
ULTRA series
1-Channel-aSTEM Detector Detecting transmitted Electrons in an FESEM with the new Annular STEM Detector 15xx uniplinth (i.e. from serial no. 2000)
SUPRA series
ULTRA series
AURIGA series
NEON series
3D EBSD
Combination of FIB slicing and EBSD mapping for a unique 3D view 1540 EsB
1540 XB
1560 XB
AURIGA series
NEON series
NVision 40
3D Surface Modelling 3D surface modelling software EVO series
SIGMA series
SUPRA series
ULTRA series
GeminiSEM series
MERLIN series
1540/60 XB series
NEON series
NVision series
AURIGA series
Crossbeam series
4-Channel-aSTEM Detector Detecting transmitted Electrons in an FESEM with the new Annular STEM Detector Crossbeam series
GeminiSEM series
MERLIN series
AFM 3D Resolution at the atomic Level with the Atomic Force Microscope SIGMA series
SUPRA series
ULTRA series
GeminiSEM series
MERLIN series
1540/60 XB series
NEON series
AURIGA series
Crossbeam series
Airlock Fast insertion of specimen and full software control
15xxXB series
AURIGA series
Crossbeam series
SIGMA series
SUPRA series
ULTRA series
GeminiSEM series
MERLIN series
NEON series
NVision 40
Atlas 5 Master Your Multi-scale Challenge EVO series
SIGMA series
SUPRA series
ULTRA series
GeminiSEM series
MERLIN series
1540/60 XB series
NEON series
AURIGA series
Crossbeam series
Dual Joystick and Control Panel
Comfortable and easy operation of FE-SEM
EVO series
SIGMA series
15xx series
SUPRA series
ULTRA series
MERLIN series
GeminiSEM series
15xx XB series
NEON series
AURIGA series
NVision
Crossbeam series
EsB Detector Energy selective backscattered (EsB) detector for clear compositional contrast 1540 EsB
AURIGA series
MERLIN series
NEON series
ULTRA series
FIB Column Enables micro- and nano-structuring and provides enhanced functionalities Canion and Cobra FIB columns:
AURIGA series
1540 XB
1540 EsB
1560 EsB
NEON series

Capella FIB column:
Crossbeam series
FIB-SIMS Powerful Surface Analysis with Focused Ion Beam - Secondary Ion Mass Spectrometry Depth Profiling 15xx series
NEON series
AURIGA series
Crossbeam series
Red TEM Electronics Update Extended instrument lifetime and new functionalities EM 109
EM 900
ZEN Correlative Array Tomography 3D Correlative Light and Electron Microscopy For Serial Sections  Light Microscopes
Axio Imager.Z2
Axio Observer.Z1
Electron Microscopes
GeminiSEM 300/500
Sigma 300/500
Merlin
Merlin Compact
Auriga
Supra
Ultra
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