Xradia Versa Upgrades

For an Increased Life Time and Extended Functionality

Accessories

Upgrade your microscope with additional accessories such as sample holders, CT scaling Phantoms, and additional X-ray filters to enhance your Xradia Versa capability

Sample Holders

Securely mount a broad range of sample sizes and types by choosing from a suite of sample holders designed by ZEISS

ZEISS sample holders are designed with kinematic principles in mind for accurate and repeatable placement on the sample stage. Each design offers unique gripping techniques to accommodate your sample properly for imaging. In addition, the designs are proven for X-ray imaging stability. Specify whether your mount is for standard use or to be compatible with the Autoloader.

Benefits

  • Support stable mechanical and thermal mounting techniques
  • Easy on/off exchange
  • Automatic presence sensing (Autoloader compatible)
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CT Scaling Phantoms and Filter Options

Customize your X-ray spectrum to meet your imaging application needs and correlate your grayscale data against appropriate Hounsfield units

Ensure that your data is properly calibrated to Hounsfield units, in which air and water have values of 0 and 100, by using the ZEISS CT Scaling Phantom. Extend your range of low-energy and high-energy filters by exploring the additional filter options offered by ZEISS for higher energy filtering requirements and applications such as metallurgy.

Benefits

  • Calibrate your grayscale data accurately
  • Benefit from a reduction of beam hardening artifacts
  • Improved transmission on dense or larger materials
  • Experience higher magnification
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Analysis & Software

Enhance the user experience and the depths of your analysis workflow using advanced hardware and computational software available through ZEISS.

Analysis Workstation - Versa

The ZEISS secondary workstation is configured and proven for visualization and computational performance, as well as data storage reliability

In order to maintain instrument uptime for imaging, many prefer streamlining their workflow via a secondary analysis workstation. The secondary workstation supports additional studies optimizing reconstruction, navigating and visualizing datasets, and post-processing results.

Benefits

  • Maximize imaging uptime
  • Improve results throughput
  • Supports advanced visualization and analysis software packages
  • Extends data storage reliably
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Your guide to Scout and Scan upgrades:
 
  • Interactive tool to learn more about Scout and Scan
  • Easy software upgrade guide
  • Workstation compatibility information
  • Learn more about available additional software funtionallity
  • Additional information about other XRM modules

Note: Press ESC to exit full-screen mode

ORS Dragonfly Pro

Easy to use, advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy

Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation and object analysis to quantify your results.

Lithium-ion Battery

Benefits

  • High definition graphics rendering
  • Create rich 3D videos
  • Object analysis
  • Machine learning segmentation
  • Macro recording for repetitive workflows
  • Python customization software packages
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SmartShield

Protect Your Sample to Optimize Experiment Setup

SmartShield is a simple solution that protects your sample and your microscope, working within Scout-and-ScanTM control system. SmartShield wraps a digital “envelope” around your sample with an easy click of a button. This automated solution allows you to confidently bring your sample even closer to the source and detector. With SmartShield, new and advanced users alike can experience an elegant sample setup workflow and efficient navigation of the Versa system.

Benefits

  • Fully integrated rapid envelope creation within 5 minutes
  • 3D awareness for sample and instrument safety
  • Enhanced operator efficiency during setup
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In situ Upgrades

Discover add-on integrated tensile testing solutions for in situ X-ray applications.

In situ Deben Stages

ZEISS offers a suite of multiple custom testing stages to be used within a Versa X-ray system for in situ imaging

A modular tensile & compression testing system can be installed within the Versa system to achieve clear visual interpretation of how the properties of materials and composites change under different loading conditions.

Benefits

  • Integrated in situ recipe control for Deben stages
  • In situ interface kit option
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In situ Interface Kit

The In situ Interface Kit for Xradia Versa will optimize your set-up and operation, providing you with the results you're looking for faster and with a higher ease of operation

Experience the highest level of stability, flexibility and controlled integration of several types of in-situ devices on the Xradia Versa, which benefit from an optical architecture that takes into account resolution in variable environmental conditions. Perform in situ and 4D (time dependent studies) to understand the impact of heating, cooling, wetting, tension, tensile compression, drainage and other simulated environmental studies.

Benefits

  • Resolution at a Distance (RaaD) enables superior in situ imaging
  • Custom in situ flow interface kit by special order
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Modules & Components

Extend the capabilities of your system with add-ons and modules.

Advanced Reconstruction Toolbox

Flexibility based on your research requirements

The Advanced Reconstruction Toolbox is an innovative platform on your ZEISS Xradia 3D X-ray microscope for accessing advanced reconstruction technologies. Unique modules leverage deep understanding of both X-ray physics and customer applications to solve some of the hardest imaging challenges in new and innovative ways.

Benefits

  • Improve data collection and analysis for accurate and faster decision-making
  • Greatly enhance image quality
  • Achieve superior interior tomography or throughput on a broad class of samples
  • Reveal subtle difference through improved contrast-to-noise
  • Increase speed at an order of magnitude for sample classes requiring repetitive workflow
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ZEISS OptiRecon

Similar results, 4x faster

Accelerate scan times by up to 4X or achieve enhanced image quality across broad class of samples using fast and efficient iterative reconstruction algorithms.

OptiRecon 4X Throughput for Battery Research
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ZEISS DeepRecon

Imaging throughput up to 10X faster for repetitive samples

Accelerate scan times by up to 10X or achieve superior image quality for repetitive workflow applications using artificial intelligence-based (deep learning) reconstruction algorithms.

DeepRecon for Repetitive Workflows – 9X Throughput for Geo Science Exploration
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LabDCT

Unlock grain structure and crystallographic information from within your lab

Achieve direct visualization of 3D crystallographic grain orientation and morphology in a non-destructive tomography environment with the LabDCT advanced imaging module powered with GrainMapper3D software by Xnovo Technology. Achieve enhanced understanding of the fundamental materials science behind these processes with microscopic imaging features in three dimensions.

Benefits

  • Acquire and reconstruct crystallographic information
  • Direct 3D visualization of grain orientation and morphology
  • Non-destructive grain structure information
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Metrology Extension

Reveal smallest dimensions - Measure them most accurately

Miniaturization and integration of components drive growing demand for high-resolution metrology. ZEISS introduced an entirely new realm of non-destructive insights into submicron details with Xradia Versa X-ray microscopes. Benefit from high-resolution X-ray imaging combined with high-precision metrology. Get verified measurement accuracy of smalldimensions in reconstructed volumes of lessthan 125 mm3.

Non-contact, non-destructive measurement of a smartphone camera lens module.

Benefits

  • Small volumes at high resolution
  • Simple calibration workflow
  • Leading CT metrology accuracy
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Autoloader

Increase efficiency of sample handling and repetitive measurements by using the ZEISS Autoloader

By adding the Autoloader to your configuration, you can set-up queues of imaging jobs across a shift or over a weekend. Receive automatic notification of job completion. Minimize user interaction in your research or industrial laboratory, industrial process development, service laboratory, or university central imaging laboratory.

Benefits

  • Achieve precise and repeatable sample measurements
  • Flexible sample handing for multiple sample types
  • Automate measurements setup
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FPX (Flat Panel Extension)

Enhance imaging flexibility for even larger samples with high throughput at ZEISS best-in-class image quality

Image large samples and create workflow effeciencies with FPX for industrial and academic research. Rapidly scout large areas to identify a desired region of interest (ROI). Combine FPX with RaaD on Xradia 500-series and 600-series and benefit further from high resolution imaging for a variety of samples.

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Benefits

  • Image large samples with best-in-class quality
  • High resolution images for zoomed in ROIs
  • Full FOV for 5inch diameter samples with high throughput
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System Upgrades

Increase your instrument performance and capabilities by upgrading to the next model

Xradia 510/520 Versa to Xradia 610/620 Versa

Upgrade to ultimate versatility

The ZEISS Xradia 620 Versa 3D X-ray microscope unlocks new degrees of flexibility for your scientific discovery. Building on industry’s best resolution and contrast, Xradia 620 Versa expands the boundaries of non-destructive imaging for break¬through flexibility and discernment critical to your research.

Protect Your Investment
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Benefits

  • Attain down to sub-micron resolution
  • Advanced phase contrast techniques for image enhancements
  • Non-destructive characterization in-situ and in 4D
  • Higher X-ray flux and faster scans without compromising resolution
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