ZEISS Xradia CrystalCT

The first commercially available crystallographic imaging microCT system.

ZEISS Xradia CrystalCT is your ground-breaking microCT for unlocking the crystallographic and microstructural secrets of your samples. It uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, etc.) can be studied, leading to newer and deeper insights into materials research.

product image ZEISS Xradia CrystalCT
  • Perform non-destructive mapping of grain morphology in 3D.
  • Characterize materials such as metals, alloys, and ceramics.
  • Map larger volumes and a wider array of sample geometries at higher throughput.
  • Advance materials characterization and discovery through ground-breaking diffraction scanning modes.
  • Achieve superior sample representivity to create high fidelity computational models.

Highlights

DCT projection geometry schematic
Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography (ACT) and diffraction contrast tomography (DCT)

DCT for an Expanded Range of Research Possibilities

ZEISS Research Microscopy Solutions and Xnovo Technology have partnered to deliver revolutionary laboratory diffraction contrast tomography (DCT) capability. Using 3D grain mapping, DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.


Aluminum “dogbone” imaged with DCT
Al-4wt%Cu sample with gauge section dimension of (length) 1.25 mm, (width) 1.0 mm and (thickness) 0.5 mm. Sample scanned using helical phyllotaxis HART.

Superior Sample Representivity from Advanced Diffraction Scan Modes

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes.

  • Provides unprecedented sample representivity.
  • Enables scanning larger sample volumes.
  • Simplifies sample prep and handling of irregular/natural sample shapes.
  • Increases speed.
  • Addresses sample specificity.

These advanced modes overcome some of the previous challenges of conventional DCT data collection that assume the sample ROI is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample. Inspired by nature’s golden angle, advanced diffraction scanning modes deliver helical phyllotaxis schema to manage a wide range of sample shapes and sizes.


Steel-reinforced concrete microCT image
Quantitative volumetric analysis of a steel reinforced concrete specimen. Voids are rendered in purple.

A Powerful MicroCT Platform

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you can obtain high quality, high resolution scans with best-in-class contrast. Image entire objects or devices to reveal interior details in their full 3D context. Faster acquisition speeds enable you to run samples in a shorter time, increasing your productivity and profitability. Non-destructive CT also enables in situ and 4D studies to understand practically the impact of varying conditions over time. The ZEISS Xradia imaging system combines its proven hardware architecture with state-of-the-art stability and drift compensation features. It is because of the superior stability of this renowned platform that CrystalCT consistently surpasses one’s comprehension of what a microCT can achieve.


[Achtung!]

[Die Inhalte der Columns oberhalb und unterhalb dieses Kommentars sind völlig identisch. Oberhalb ist für Mobile View zuständig, unterhalb für Desktop View.]

DCT for an Expanded Range of Research Possibilities

ZEISS Research Microscopy Solutions and Xnovo Technology have partnered to deliver revolutionary laboratory diffraction contrast tomography (DCT) capability. Using 3D grain mapping, DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.

Superior Sample Representivity from Advanced Diffraction Scan Modes

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes.

  • Provides unprecedented sample representivity.
  • Enables scanning larger sample volumes.
  • Simplifies sample prep and handling of irregular/natural sample shapes.
  • Increases speed.
  • Addresses sample specificity.

These advanced modes overcome some of the previous challenges of conventional DCT data collection that assume the sample ROI is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample. Inspired by nature’s golden angle, advanced diffraction scanning modes deliver helical phyllotaxis schema to manage a wide range of sample shapes and sizes.

A Powerful MicroCT Platform

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you can obtain high quality, high resolution scans with best-in-class contrast. Image entire objects or devices to reveal interior details in their full 3D context. Faster acquisition speeds enable you to run samples in a shorter time, increasing your productivity and profitability. Non-destructive CT also enables in situ and 4D studies to understand practically the impact of varying conditions over time. The ZEISS Xradia imaging system combines its proven hardware architecture with state-of-the-art stability and drift compensation features. It is because of the superior stability of this renowned platform that CrystalCT consistently surpasses one’s comprehension of what a microCT can achieve.

Fields of Application

Metals, Ceramics, Semiconductor, Geoscience, Pharmaceuticals, and more

ZEISS Xradia CrystalCT delivers cutting edge, radically different diffraction scanning technology, uniquely offering the ability to map grain boundary surfaces over significantly larger volumes in their native state while targeting realistic sample geometries that suit the common requirements of research and industrial labs. Unlike other grain mapping technologies, DCT enables non-destructive 3D grain imaging.

Grain map of aluminum-copper alloy
3D grain map of aluminum copper alloy imaged in absorption and diffraction contrast tomography.

Materials Science

  • Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information.
  • Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy.
  • Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles.
  • 4D imaging through ex situ or in situ experiments to see how materials evolve, e.g., through mechanical load or corrosion.

Ultra-thin steel sample imaged with advanced scanning modes
3D grain map of an ultra-thin oriented electrical steel sample with dimension of (RD) 4 mm, (TD) 2 mm and (ND) 0.08 mm.

Metals & Minerals

  • Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
  • Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
  • High contrast 3D imaging for in situ flow studies or 3D mineralogy.

Semiconductor-solar panel imaged in high aspect ratio tomography mode
3D grain map of polysilicon materials from a solar panel with height of 30 mm.

Manufacturing

  • Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
  • Perform crystallography-based print quality assessment in 3D printed metal parts.
  • High throughput scanning of intact devices with fast time to results.
  • Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

Intact mouse model imaged with microCT
2D virtual cross-section and a cutaway view of 3D rendering of a mouse embryo embedded in paraffin.

Life Sciences

  • Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
  • Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

[Achtung!]

[Die Inhalte der Columns oberhalb und unterhalb dieses Kommentars sind völlig identisch. Oberhalb ist für Mobile View zuständig, unterhalb für Desktop View.]

Materials Science

  • Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information.
  • Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy.
  • Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles.
  • 4D imaging through ex situ or in situ experiments to see how materials evolve, e.g., through mechanical load or corrosion.

Metals & Minerals

  • Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
  • Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
  • High contrast 3D imaging for in situ flow studies or 3D mineralogy.

Manufacturing

  • Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
  • Perform crystallography-based print quality assessment in 3D printed metal parts.
  • High throughput scanning of intact devices with fast time to results.
  • Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

Life Sciences

  • Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
  • Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

Technology Insights

Super Sample Representivity

Sample Representivity Diagram

Sample representivity – obtaining large volumes of real data to create high fidelity computational models – has been a challenge for crystallographic imaging.

ZEISS Xradia CrystalCT offers advanced DCT modes that overcome some of the previous challenges of conventional DCT data collection that assumes the ROI in the sample is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample.

ZEISS Xradia CrystalCT advanced diffraction scanning modes include

  • Helical Phyllotaxis
    Helical phyllotaxis rotation is used for long aspect ratio cylindrical samples.
  • Helical Phyllotaxis Raster
    Helical phyllotaxis raster is used for samples that are typically wider than the field of view.
  • Helical Phyllotaxis HART
    Phyllotaxis with high aspect ratio tomography, or HART, solves the problem of flat or plate-like sample imaging.

3D Grain Reconstruction

Index grain data precise, fast & automated

After the initial acquisition as the first step in your workflow you then start to reconstruct. Load your absorption tomography and your diffraction data into GrainMapper3D. Let it identify potential candidates for grain orientations of a given polycrystal by using back and forward projections.

An automated, iterative search for grains in the sample volume is your next step. Grain reconstruction results are stored as stacks of slices or volume datasets that contain the full description of the indexed grains. Eventually, share 3D LabDCT results with your collaborators or customers using the standalone GrainMapper3D Viewer application.

3D Grain Mapping

3D Grain Mapping

Get all information in one file

Your final step is to get out all the information you need in one single file. Shape, orientation and spatial locations of all grains in the sample volume are exported into an open data format.

Finish your experiment with subsequent analyses using customized software or simulation tools. The advanced indexation routines now support the more complex lower symmetry crystal systems.

ZEISS Advanced Reconstruction Toolbox

Better image quality, higher throughput

The Advanced Reconstruction Toolbox is an innovative platform on your ZEISS Xradia 3D X-ray microscope (XRM) or microCT for accessing advanced reconstruction technologies. Unique modules leverage deep understanding of both X-ray physics and customer applications to solve some of the hardest imaging challenges in new and innovative ways.

Here is what you can find about this latest technical advancement in Xradia technology:

With the Advanced Reconstruction Toolbox, you are able to:

  • Improve data collection and analysis for accurate and faster decision-making
  • Greatly enhance image quality
  • Achieve superior interior tomography or throughput on a broad class of samples
  • Reveal subtle difference through improved contrast-to-noise
  • Increase speed at an order of magnitude for sample classes requiring repetitive workflow

These optional modules are workstation-based solutions for easy access and usability:  

  • OptiRecon
  • DeepRecon

ZEISS OptiRecon

Similar results, 4x faster

ZEISS OptiRecon is an implementation of iterative reconstruction that greatly increases acquisition throughput, while optimizing image quality.
ZEISS OptiRecon allows you to achieve good image quality with about one quarter of the data acquisition time for many samples typically found in the academic and industrial energy, engineering, natural resources, biological, semiconductor, manufacturing, and electronics research fields.

OptiRecon 4X Throughput for Battery Research
OptiRecon 4X Throughput for Battery Research
Mobile phone camera module demonstrating 4X throughput improvement with comparable image quality
Mobile phone camera module demonstrating 4X throughput improvement with comparable image quality

Slide right to left to compare:

Standard Reconstruction #300Zoom OptiRecon #300Zoom
Standard Reconstruction
OptiRecon

Application Examples

4X Throughput for Mining Powder

Flexibility for Rock Exploration 
– Image Quality vs. Throughput

4X Throughput for Battery Research

Flexibility for Battery Research
– Image Quality vs. Throughput

2X Throughput for 2.5D Semiconductor Package (50 mm x 75 mm)

Improved Image Quality for 2.5D Semiconductor Package (50 mm x 75) 

2X Throughput for Semiconductor Package

Improved Image Quality for Semiconductor Package


ZEISS DeepRecon

Imaging throughput up to 10X faster for repetitive samples

ZEISS DeepRecon for ZEISS Xradia X-ray systems is the first commercially available deep learning reconstruction technology. It enables you to increase throughput by an order of magnitude (up to 10X), without sacrificing novel XRM resolution at a distance, for repetitive workflow applications. DeepRecon uniquely harvests the hidden opportunities in big data generated by your Xradia platform and provides significant AI-driven speed or image quality improvement.

DeepRecon for Repetitive Workflows – 9X Throughput for Geo Science Exploration
DeepRecon for Repetitive Workflows – 9X Throughput for Geo Science Exploration

SmartShield

Easily Protect Your Sample to Optimize Experiment Setup

SmartShield is a solution that protects your sample and your microscope. This automated collision avoidance system works within the Scout and Scan Control System. It enables you to navigate Xradia platforms more confidently than ever. How it works - with the click of a button SmartShield creates a digital protective layer based on the dimensions of your sample.

SmartShield lets you benefit from:

  • Improved operator efficiency enabled by a streamlined sample setup
  • Enhanced user experience for novice and advanced users
  • Protecting your valuable samples and your investment
  • Uncompromising scan quality
Watch this video and gain insights into the workflow guided by SmartShield.

Accessories

in situ experiments

Push the limits for scientific advancement

ZEISS Xradia X-ray systems provide the industry’s premier 3D imaging solution for the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages.

Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments. ZEISS Xradia microCT platforms can accommodate a variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages, to user-customized designs. You can add the optional in situ Interface Kit to your ZEISS Xradia CrystalCT, which includes a mechanical integration kit, a robust cabling guide and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Scout-and-Scan user interface. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia CrystalCT to an Xradia 620 Versa X-ray microscope to leverage Resolution at a Distance (RaaD) technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.

Tensile testing of laser welded steel under increasing load.
Tensile testing of laser welded steel under increasing load.

Autoloader

Increase your sample handling efficiency

Maximize your instrument's utilization with the optional Autoloader, available for all instruments in the ZEISS X-ray microscope platforms. Reduce the frequency of user interaction and increase productivity by queueing multiple jobs. Load up to 14 sample stations, which can support up to 70 samples, and set to run overnight, or across multiple days. Unprecedented mechanical stability enables high volume quantitative repetitive scanning of like samples.

Autoloader option enables you to program up to 70 samples at a time to run sequentially.
Autoloader option enables you to program up to 70 samples at a time to run sequentially.

Software

Create Efficient Workflows by Using The Simple Control System

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

Benefit from:

  • Internal camera for sample viewing
  • Recipe control (set, save, recall)
  • Multiple energies
  • Multiple samples with Autoloader option
  • Micropositioning capability with a simple mouse click
Scout-and-Scan Control System
Scout-and-Scan Control System
Lithium-ion Battery
Lithium-ion Battery

Visualization and Analysis Software

ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

more

ZEISS ZEN Intellesis for Image Segmentation in Microscopy

ZEISS ZEN Intellesis for Image Segmentation in Microscopy

Use the power of deep learning to easily segment your images and to get access to their real value - the data they provide. Image segmentation lays the foundation for all subsequent image analysis steps. ZEISS ZEN Intellesis uses deep learning and Python to easily create reproducible segmentation results, even for non-experts. Train the software once and then ZEISS ZEN Intellesis can segment a batch of hundreds of images automatically. You save time and minimize user bias.

Learn more about ZEISS ZEN Intellesis for Image Segmentation in Microscopy

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World’s first crystallographic imaging microCT for academic and industrial applications.

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Product Brochure

CrystalCT

Download the DCT technology note

White Paper

Laboratory-based Diffraction Contrast Tomography