ZEISS Xradia 410 Versa

Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). Enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers.

• Non-destructive 3D imaging to preserve and extend the use of valuable samples
• High spatial resolution down to <0.9 µm and voxel size to 100 nm
• Advanced contrast solutions for low Z materials and soft tissue
• Industry-leading 4D and in situ capabilities for flexible sample sizes and types
• Scout-and-Scan™ control system for easy-to-use workflow set-up, ideal in multi-user environments
• Heavy load sample stage and extended source and detector stage travel
• Minimal need for sample preparation
• Easy navigation through multiple magnification detector system
• Continuous operation through automated multiple point tomography and repetitive scanning
• High speed reconstruction
• Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up while delivering the highest 3D resolution for in situ applications
• Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning
  

All of the features on Xradia 410 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.
 

New on Version 11:

• Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller.

• New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards.

• Adaptive Motion Compensation is a new method to compensate for sample drift that may occur during the course of a tomography, such as with soft samples.

• The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction.

• The new Enhanced Histogram capability allows you to incorporate color palette and log scaling for better data visualization.