Take advantage of ZEISS microscopy solutions for your materials research. As future materials demand to be lighter, faster, stronger, smarter, and more durable engineering innovations will require an ever-better understanding of their complexity. You will need characterization techniques that help you to connect processing and structure with properties and performance.
Study your fields of interests in materials research in detail and characterize features such as grain structure and sizes, texture, phases and phase transitions, volume fractions, inclusions, and impurity distributions by:
- Expanding your possibilities with next-generation engineering materials.
- Developing energy devices for mobility and sustainability.
- Powering miniaturization technologies with nanomaterials.
- Investigating soft materials like polymers, catalysts, coatings and chemicals to gain a better understanding of their properties or by studying biomaterials through learning from the natural world.
Achieve advances in materials science and engineering no matter whether you perform your research in academia or industry. ZEISS systems are designed to provide you all the data you need.
- Get to results fast and perform multi-modal, multi-scale microscopy with comprehensive workflow solutions.
- Analyze your samples from 2D to 3D to 4D.
- Start with low resolution light or stereo microscopy, followed by high resolution SEM.
- Open up the third dimension using X-ray microscopy or FIB-SEM.
- Analyze chemical composition, crystal orientation or mechanical properties with EDS, EBSD, lab-based diffraction contrast tomography and in situ tensile or heating experiments.
- Connect and analyze data with software solutions for correlative experiments allowing processing your data aided by machine learning image segmentation.
Basic concepts in microscopy
Through various sections, learn more about the principles of microscopy and get detailed advice and comments on how to use the different methods with your microscope. For instance, start with the concepts of image formation, numerical aperture and the Köhler illumination.
Optical microscopes belong to a class of instruments that are said to be diffraction limited, meaning that resolution is determined in part by the number of diffraction orders created by the specimen that can be successfully captured by the objective and imaged by the optical system.
Illumination of the specimen is the most important variable in achieving high-quality images in microscopy and critical photomicrography. Köhler illumination was first introduced in 1893 by August Köhler of the Carl Zeiss corporation as a method of providing the optimum specimen illumination.
The numerical aperture of a microscope objective is the measure of its ability to gather light and to resolve fine specimen detail while working at a fixed object (or specimen) distance. Resolution is determined by the number of diffracted wavefront orders captured by the objective.