ZEISS microscopy solutions for fracture analysis

Identifying metal layers, decarburization, oxide corrosion, striations, voids, fatigue origin, crack growth and propagation

With a large magnification range and good depth of field, scanning electron microscopy (SEM) is well-suited to identifying metal layers, decarburization, oxide corrosion, striations, voids, fatigue origin, crack growth and propagation. However, clues that help understand the reasons for fracture and subsequent failure are often on the micro scale and difficult to find in large samples.

ZEISS offers several solutions that employ automated intelligent imaging workflows to automatically scan large user-defined areas at extremely high resolutions to collect large easy-to-navigate image maps.

Application images

for Fracture Analysis

Failure analysis techniques that systematically analyze a failed component can help determine the reason for degraded performance or malfunction.

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