Recommended X-ray Microscopy Products for Materials Research and Industry

X-ray Microscopy

Xradia Versa: Extend the Boundaries of Science

Get the maximum information from your sample and perform 4D and in situ measurements – either with X-ray microscopy (XRM) alone or in conjunction with other correlative electron and light microscopy techniques enabled by XRM’s nondestructive, high resolution 3D imaging. Xradia Versa solutions enable breakthrough research in materials science, energy, electronics, and other prominent research areas with non-destructive imaging and 3D quantitative analysis. X-ray microscopy is your imaging methodology, complementing and increasing the effectiveness of traditional techniques. In materials science research, you use Xradia Versa for 4D microstructural evolution, failure analysis, to study the iteration between physical experiments and computational models, to study devices in operando, and more.

Flexible. Integrated. Non-destructive.

  • Non-destructive X-ray imaging for 3D and interior study of valuable samples.
  • Industry leading spatial resolution of 700 nm, with available voxel sizes below 100 nm. Resolution at a distance for wide range of sample dimensions uniquely allow for high resolution and image contrast, even for larger samples and interior imaging.
  • Unprecedented contrast for phases or features of interest for difficult-to-discern materials.
  • Non-destructive nature of XRM allows for 4D and in situ imaging.


ZEISS architecture enables highest contrast and resolution when conducting such studies.

Created for Your Applications

Non-destructive imaging of crack propagation and fracture mechanics on a wide range of materials from metals to ceramics.

  • Submicron imaging of building materials to improve construction as well as provide greater degrees of safety from natural disasters.
  • Characterizing microstructures with thermal and mechanical studies to visualize and quantify the impact of tension, compression, temperature on permeability, even corrosive environments.
  • Multi-length scale imaging to model voids, cracks and other failure mechanisms of lightweight carbon fibers used as structural reinforcements, in airplane wings and as electrical conductors.
  • Segmentation of materials using unique contrast mechanisms. Understanding volumetric changes, such as solid deformation, pore evolution, and crack propagation are fundamental to understand how materials form, deform, and perform.

 

Xradia Ultra: Synchrotron-quality Imaging in a Lab System

Non-destructive imaging with X-rays provides detailed 3D volumetric data of internal structures without the need for cutting or sectioning at the region of interest, enabling repeated imaging of the same sample. Xradia Ultra is the only lab-based sub-50 nm spatial resolution scanner for 3D visualization of microscopic sample volumes. This XRM combines a high-flux laboratory X-ray source with specialized X-ray optics to bridge the gap between existing high resolution imaging modalities such as FIB-SEM, TEM or AFM, and optical microscopy or conventional microCT.

Simpler. More Intelligent. More Integrated.

  • With resolution below 50 nm, ZEISS Xradia Ultra is the world’s highest resolution 3D X-ray microscope, providing nanoscale insights of interior structures non-destructively.
  • High spatial resolution and large field-of-view modes.
  • Integrated Zernike phase contrast imaging enhances the visibility of all edges and interfaces when absorption contrast is low.
  • Efficient high-resolution analysis in a correlative workflow: serves as a roadmap for targeting site-specific regions of a sample to more efficiently find buried features of interest in FIB/SEM, minimizing the risk of destroying the feature or spending excessive milling time searching for it.

 

Created for Your Applications

  • Characterization of composite and other functional materials to understand properties such as porosity, cracks and phase distribution.
  • High resolution detection of features and crack propagation without compromising samples for future study.
  • Fast, large-volume, multi-phase measurement of energy materials, including porosity, electrical conductivity, and other critical aspects.
  • High spatial resolution and large field-of-view modes, enabling non-destructive microstructure measurements at multiple length scales.
  • Non-destructive imaging of in operando batteries, fuel cells, and other energy storage devices, allowing direct imaging and measurement of the electrode properties during operation.

Recommended Products for X-ray Microscopy

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