Events Microscopes and Imaging Solutions

Contrast Beyond Resolution Online Seminar - ZEISS FE SEM Technology

Date

10/27/2020  12:30 - 16:00

Location

Singapore / APAC

Exhibitor

Studying nanomaterials and samples in their pristine nature, especially beam-sensitive materials, necessitates low voltage imaging. Under these conditions, understanding the electric, magnetic and microstructural crystalline properties at the nanoscale are highly desired beyond the conventional analysis such as morphology, topography and atomic/elemental contrast in electron microscopes.

Developments in Field Emission Scanning Electron Microscopes (FESEMs) have pushed frontiers of low voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allow researchers and users in seeing beyond high-resolution micrographs.

The Gemini column introduced by ZEISS around 27 years ago has been designed to provide optimal low voltage imaging and analytical performance with ease of use. As we see an increasing adoption of this architecture, it is beneficial to understand the advantages of this column, detectors and its “sweet spots” that provides several contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast and scanning transmission electron microscopy in SEM to enable several applications in studying engineering materials, electronic materials and nanomaterials.